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1. WO2020133791 - DOUBLE PROBE SYSTEM AND PRINTED CIRCUIT BOARD DETECTING DEVICE

Publication Number WO/2020/133791
Publication Date 02.07.2020
International Application No. PCT/CN2019/081805
International Filing Date 08.04.2019
IPC
G01R 1/073 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 1/07307
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
G01R 1/07392
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07392manipulating each probe element or tip individually
G01R 31/2806
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Applicants
  • 南京协辰电子科技有限公司 JOINT STARS TECHNOLOGY CO., LTD [CN]/[CN]
Inventors
  • 李景涛 LI, Jingtao
Agents
  • 南京睿之博知识产权代理有限公司 NANJING RUIZHIBO INTELLECTUAL PROPERTY AGENCY CO., LTD.
Priority Data
201811614915.627.12.2018CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) DOUBLE PROBE SYSTEM AND PRINTED CIRCUIT BOARD DETECTING DEVICE
(FR) SYSTÈME À DOUBLE SONDE ET DISPOSITIF DE DÉTECTION DE CARTE DE CIRCUIT IMPRIMÉ
(ZH) 双探针系统及印制电路板检测设备
Abstract
(EN)
Provided are a double probe system and a printed circuit board detecting device, comprising a fixed bracket (1), a probe driving mechanism (2) fixed on the fixed bracket (1), and a spacing adjustment mechanism (3) driven by the probe driving mechanism (2), wherein, the spacing adjustment mechanism (3) comprises a linear driving assembly (31), a rail assembly (32), a first probe assembly and a second probe assembly, at least one of the first probe assembly and the second probe assembly is a movable probe assembly (34) that slides back and forth along the rail assembly (32) driven by the linear driving assembly (31). In the double probe system and the printed circuit board detecting device, the movable probe assembly (34) can move along the rail assembly (32) driven by the linear driving assembly (31), so as to adjust the relative position between the fixed probe assembly (33) and the movable probe assembly (34), simultaneous probing of the double probe during the detecting of the printed circuit board can be achieved, the detection of multiple printed circuit boards can be achieved by only moving a single printed circuit board detecting device, greatly improving the detection efficiency.
(FR)
La présente invention porte sur un système à double sonde et sur un dispositif de détection de carte de circuit imprimé, comprenant un support fixe (1), un mécanisme d'entraînement de sonde (2) fixé sur le support fixe (1), et un mécanisme de réglage d'espacement (3) entraîné par le mécanisme d'entraînement de sonde (2), le mécanisme d'ajustement d'espacement (3) comprenant un ensemble d'entraînement linéaire (31), un ensemble rail (32), un premier ensemble sonde et un second ensemble sonde, le premier ensemble sonde et/ou le second ensemble sonde étant un ensemble sonde mobile (34) qui coulisse en va-et-vient et le long de l'ensemble rail (32) entraîné par l'ensemble d'entraînement linéaire (31). Dans le système à double sonde et le dispositif de détection de carte de circuit imprimé, l'ensemble sonde mobile (34) peut se déplacer le long de l'ensemble rail (32) entraîné par l'ensemble d'entraînement linéaire (31) de sorte à régler la position relative entre l'ensemble sonde fixe (33) et l'ensemble sonde mobile (34), un sondage simultané de la sonde double pendant la détection de la carte de circuit imprimé peut être obtenu, la détection de multiples cartes de circuit imprimé peut être obtenue en déplaçant seulement un seul dispositif de détection de carte de circuit imprimé, ce qui améliore considérablement l'efficacité de détection.
(ZH)
一种双探针系统及印制电路板检测设备,包括固定支架(1)、固定于固定支架(1)的探针驱动机构(2)以及由探针驱动机构(2)驱动的间距调整机构(3),间距调整机构(3)包括直线驱动组件(31)、导轨组件(32)、第一探针组件和第二探针组件,第一探针组件和第二探针组件中至少之一为在直线驱动组件(31)驱动下沿导轨组件(32)往复滑动的活动探针组件(34)。该双探针系统及印制电路板检测设备,活动探针组件(34)可以在直线驱动组件(31)的带动下沿着导轨组件(32)移动,从而对固定探针组件(33)和活动探针组件(34)之间的相对位置进行调整,可以实现对印制电路板检测过程中双探针的同步探刺,可以通过仅移动单个印制电路板检测设备实现多印制电路板的检测,大大的提高了检测效率。
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