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1. WO2020118219 - SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

Publication Number WO/2020/118219
Publication Date 11.06.2020
International Application No. PCT/US2019/065011
International Filing Date 06.12.2019
IPC
G01B 21/04 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
02for measuring length, width, or thickness
04by measuring coordinates of points
CPC
G01B 11/005
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
002for measuring two or more coordinates
005coordinate measuring machines
G01B 11/03
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
02for measuring length, width or thickness
03by measuring coordinates of points
G01B 21/04
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
02for measuring length, width, or thickness
04by measuring coordinates of points
G01B 2210/52
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
2210Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
52Combining or merging partially overlapping images to an overall image
G01B 2290/45
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
2290Aspects of interferometers not specifically covered by any group under G01B9/02
45Multiple detectors for detecting interferometer signals
G01B 9/0209
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9Instruments as specified in the subgroups and characterised by the use of optical measuring means
02Interferometers ; for determining dimensional properties of, or relations between, measurement objects
0209Non-tomographic low coherence interferometers, e.g. low coherence interferometry, scanning white light interferometry, optical frequency domain interferometry or reflectometry
Applicants
  • HEXAGON METROLOGY, INC. [US]/[US]
Inventors
  • KOCIC, Milan
Agents
  • SAUNDERS, Steven, G.
  • FILANDRIANOS, Emmanuel, D.
  • HADLEY, Elizabeth, H.
  • CAHILL, Ronald, E.
  • DECLOUX, Amy, M.
Priority Data
62/776,11506.12.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
(FR) SYSTÈME ET PROCÉDÉ DE MESURE UTILISANT DE MULTIPLES MODALITÉS
Abstract
(EN)
A method measures an object using a CMM having a CMM accuracy. To that end, the method provides a jogbox with a 3D scanner having a scanner accuracy, positions the object on the CMM, and scans, using the 3D scanner, the object to produce scan data of the object. The method also measures a first portion of the object using the scan data, and a second portion of the object using the CMM. The CMM accuracy is more accurate than the scanner accuracy.
(FR)
L'invention concerne un procédé de mesure d'un objet à l'aide d'une CMM présentant une précision de CMM. À cet effet, le procédé fournit une Jogbox comprenant un scanner 3D présentant une précision de scanner, positionne l'objet sur la CMM et balaie, à l'aide du scanner 3D, l'objet afin de produire des données de balayage de l'objet. Le procédé mesure également une première partie de l'objet à l'aide des données de balayage, et une seconde partie de l'objet à l'aide de la CMM. La précision de la CMM est supérieure à celle du scanner.
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