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1. WO2020117947 - SYSTEM AND METHODS OF FLUORESCENCE MICROSCOPE CALIBRATION

Publication Number WO/2020/117947
Publication Date 11.06.2020
International Application No. PCT/US2019/064492
International Filing Date 04.12.2019
IPC
G01N 21/27 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27using photo-electric detection
G02B 21/16 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
16adapted for ultra-violet illumination
G01N 21/64 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
G02B 21/00 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
CPC
G01N 21/274
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27using photo-electric detection
274Calibration, base line adjustment, drift correction
G01N 21/6458
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
645Specially adapted constructive features of fluorimeters
6456Spatial resolved fluorescence measurements; Imaging
6458Fluorescence microscopy
G01N 21/93
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
93Detection standards; Calibrating ; baseline adjustment, drift correction
G02B 21/0032
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
0004specially adapted for specific applications
002Scanning microscopes
0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
G02B 21/0076
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
0004specially adapted for specific applications
002Scanning microscopes
0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
0052Optical details of the image generation
0076arrangements using fluorescence or luminescence
G02B 21/008
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
0004specially adapted for specific applications
002Scanning microscopes
0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
008Details of detection or image processing, including general computer control
Applicants
  • UNIVERSITY OF MASSACHUSETTS [US]/[US]
Inventors
  • GRUNWALD, David
  • HUISMAN, Maximiliaan
  • SMITH, Carlas
Agents
  • SOLOMON, Mark B.
  • CARROLL, Alice, O.
  • SMITH, James, M.
  • WAKIMURA, Mary, Lou
  • BROOK, David, E.
Priority Data
62/775,23304.12.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SYSTEM AND METHODS OF FLUORESCENCE MICROSCOPE CALIBRATION
(FR) SYSTÈME ET PROCÉDÉS D'ÉTALONNAGE DE MICROSCOPE À FLUORESCENCE
Abstract
(EN)
The described embodiments are directed to a system and methods of calibrating a fluorescence microscope and/or light detection device using a calibrating apparatus. The apparatus may comprise a main body housing, a sensor head, and a microcontroller assembly disposed within the housing. The housing may include an adapter to mechanically couple the housing to a microscope. The sensor head may comprise (i) an optical power sensor to produce a power signal representative of an optical power magnitude of light applied to the optical power sensor, (ii) an optical wavelength sensor configured to produce wavelength information associated with the light applied to the optical wavelength sensor, and (iii) a light source configured to direct light toward a detection device associated with the microscope. The microcontroller assembly may be configured to generate an optical power magnitude value based on the power signal and adjusted according to the wavelength information.
(FR)
Les modes de réalisation de la présente invention concernent un système et des procédés d'étalonnage d'un microscope à fluorescence et/ou d'un dispositif de détection de lumière à l'aide d'un appareil d'étalonnage. L'appareil peut comprendre un boîtier de corps principal, une tête de capteur et un ensemble micro-dispositif de commande disposé à l'intérieur du boîtier. Le boîtier peut comprendre un adaptateur pour coupler mécaniquement le boîtier à un microscope. La tête de capteur peut comprendre (i) un capteur de puissance optique pour produire un signal de puissance représentatif d'une amplitude de puissance optique de la lumière appliquée au capteur de puissance optique, (ii) un capteur de longueur d'onde optique conçu pour produire des informations de longueur d'onde associées à la lumière appliquée au capteur de longueur d'onde optique, et (iii) une source de lumière conçue pour diriger la lumière vers un dispositif de détection associé au microscope. L'ensemble micro-dispositif de commande peut être conçu pour générer une valeur d'amplitude de puissance optique sur la base du signal de puissance et ajustée en fonction des informations de longueur d'onde.
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