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1. WO2020117917 - ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS

Publication Number WO/2020/117917
Publication Date 11.06.2020
International Application No. PCT/US2019/064436
International Filing Date 04.12.2019
IPC
G06F 11/07 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
07Responding to the occurrence of a fault, e.g. fault tolerance
G06F 11/16 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
07Responding to the occurrence of a fault, e.g. fault tolerance
16Error detection or correction of the data by redundancy in hardware
G06F 11/20 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
07Responding to the occurrence of a fault, e.g. fault tolerance
16Error detection or correction of the data by redundancy in hardware
20using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
G06F 11/22 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
CPC
G01R 31/003
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
003Environmental or reliability tests
G01R 31/2862
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
286External aspects, e.g. related to chambers, contacting devices or handlers
2862Chambers or ovens; Tanks
G01R 31/287
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
286External aspects, e.g. related to chambers, contacting devices or handlers
2868Complete testing stations; systems; procedures; software aspects
287Procedures; Software aspects
G01R 31/2874
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
2872related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
2874related to temperature
Applicants
  • MICRON TECHNOLOGY, INC. [US]/[US]
Inventors
  • THIRUVENGADAM, Aswin
  • PARTHASARATHY, Sivagnanam
  • JENSEN, Frederick
Agents
  • PORTNOVA, Marina
  • KRUEGER, Paul M.
  • ANDREEV, Dmitry
Priority Data
16/209,39304.12.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
(FR) ATTRIBUTION DE RESSOURCES DE TEST POUR EFFECTUER UN TEST DE COMPOSANTS DE MÉMOIRE
Abstract
(EN)
A request to perform a test with one or more memory components can be received. Available test resources of a test platform that is associated with memory components can be determined. The desired characteristics of the one or more memory components that are specified by the test can be determined. One or more of the available test resources of the test platform to the test can be assigned based on characteristics of respective memory components associated with the one or more of the available test resources and the desired characteristics of the one or more memory components of the test. Furthermore, the test can be performed with the assigned one or more of the available test resources of the test platform.
(FR)
Selon l'invention, une demande d'exécution d'un test avec un ou plusieurs composants de mémoire peut être reçue. Des ressources de test disponibles d'une plateforme de test qui est associée à des composants de mémoire peuvent être déterminées. Les caractéristiques souhaitées du ou des composants de mémoire qui sont spécifiés par le test peuvent être déterminées. Une ou plusieurs des ressources de test de la plateforme de test disponibles pour le test peuvent être attribuées en fonction de caractéristiques de composants de mémoire respectifs associés à la ou aux ressources de test disponibles et aux caractéristiques souhaitées du ou des composants de mémoire du test. En outre, le test peut être réalisé avec la ou les ressources de test disponibles de la plateforme de test.
Also published as
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