Processing

Please wait...

Settings

Settings

Goto Application

1. WO2020117907 - PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE

Publication Number WO/2020/117907
Publication Date 11.06.2020
International Application No. PCT/US2019/064414
International Filing Date 04.12.2019
IPC
G06F 11/07 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
07Responding to the occurrence of a fault, e.g. fault tolerance
G06F 11/16 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
07Responding to the occurrence of a fault, e.g. fault tolerance
16Error detection or correction of the data by redundancy in hardware
G06F 11/20 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
07Responding to the occurrence of a fault, e.g. fault tolerance
16Error detection or correction of the data by redundancy in hardware
20using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
G06F 11/22 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
11Error detection; Error correction; Monitoring
22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
CPC
G11C 13/004
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
13Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00 - G11C25/00
0002using resistive RAM [RRAM] elements
0021Auxiliary circuits
004Reading or sensing circuits or methods
G11C 13/0069
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
13Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00 - G11C25/00
0002using resistive RAM [RRAM] elements
0021Auxiliary circuits
0069Writing or programming circuits or methods
G11C 2029/0403
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
29Checking stores for correct operation ; ; Subsequent repair; Testing stores during standby or offline operation
04Detection or location of defective memory elements ; , e.g. cell constructio details, timing of test signals
0403during or with feedback to manufacture
G11C 2029/5002
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
29Checking stores for correct operation ; ; Subsequent repair; Testing stores during standby or offline operation
04Detection or location of defective memory elements ; , e.g. cell constructio details, timing of test signals
50Marginal testing, e.g. race, voltage or current testing
5002Characteristic
G11C 2029/5602
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
29Checking stores for correct operation ; ; Subsequent repair; Testing stores during standby or offline operation
56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
5602Interface to device under test
G11C 29/006
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
29Checking stores for correct operation ; ; Subsequent repair; Testing stores during standby or offline operation
006at wafer scale level, i.e. WSI
Applicants
  • MICRON TECHNOLOGY, INC. [US]/[US]
Inventors
  • THIRUVENGADAM, Aswin
  • PARTHASARATHY, Sivagnanam
  • SCOBEE, Daniel
Agents
  • PORTNOVA, Marina
  • ANDREEV, Dmitry
  • KRUEGER, Paul M.
Priority Data
16/209,35204.12.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE
(FR) RÉALISATION DE TEST DE COMPOSANTS DE MÉMOIRE À TOLÉRANCE AUX PANNES
Abstract
(EN)
An indication that a test resource of a test platform has failed can be received. The test resource can be associated with performing a portion of a test of memory components. A characteristic of the test resource that failed can be determined. Another test resource of the test platform can be identified based on the characteristic of the test resource that failed. The portion of the test of memory components can be performed based on the another test resource of the test platform.
(FR)
Selon l'invention, une indication selon laquelle une ressource de test d'une plate-forme de test a échoué peut être reçue. La ressource de test peut être associée à la réalisation d'une partie d'un test de composants de mémoire. Une caractéristique de la ressource de test qui a échoué peut être déterminée. Une autre ressource de test de la plate-forme de test peut être identifiée en fonction de la caractéristique de la ressource de test qui a échoué. La partie du test de composants de mémoire peut être réalisée en fonction de l'autre ressource de test de la plate-forme de test.
Also published as
Latest bibliographic data on file with the International Bureau