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1. WO2020117488 - SUBSTRATE-FREE CRYSTALLINE 2D BISMUTHENE

Publication Number WO/2020/117488
Publication Date 11.06.2020
International Application No. PCT/US2019/062716
International Filing Date 22.11.2019
IPC
B22F 1/00 2006.01
BPERFORMING OPERATIONS; TRANSPORTING
22CASTING; POWDER METALLURGY
FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
1Special treatment of metallic powder, e.g. to facilitate working, to improve properties; Metallic powders per se, e.g. mixtures of particles of different composition
B22F 9/24 2006.01
BPERFORMING OPERATIONS; TRANSPORTING
22CASTING; POWDER METALLURGY
FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
9Making metallic powder or suspensions thereof; Apparatus or devices specially adapted therefor
16using chemical processes
18with reduction of metal compounds
24starting from liquid metal compounds, e.g. solutions
C22B 5/00 2006.01
CCHEMISTRY; METALLURGY
22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
BPRODUCTION OR REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
5General processes of reducing to metals
C22B 30/06 2006.01
CCHEMISTRY; METALLURGY
22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
BPRODUCTION OR REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
30Obtaining antimony, arsenic or bismuth
06Obtaining bismuth
CPC
C01G 29/00
CCHEMISTRY; METALLURGY
01INORGANIC CHEMISTRY
GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
29Compounds of bismuth
C01P 2002/20
CCHEMISTRY; METALLURGY
01INORGANIC CHEMISTRY
PINDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
2002Crystal-structural characteristics
20Two-dimensional structures
C01P 2002/74
CCHEMISTRY; METALLURGY
01INORGANIC CHEMISTRY
PINDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
2002Crystal-structural characteristics
70defined by measured X-ray, neutron or electron diffraction data
74by peak-intensities or a ratio thereof only
C01P 2004/20
CCHEMISTRY; METALLURGY
01INORGANIC CHEMISTRY
PINDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
2004Particle morphology
20extending in two dimensions, e.g. plate-like
C30B 29/10
CCHEMISTRY; METALLURGY
30CRYSTAL GROWTH
BSINGLE-CRYSTAL-GROWTH
29Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
10Inorganic compounds or compositions
C30B 29/60
CCHEMISTRY; METALLURGY
30CRYSTAL GROWTH
BSINGLE-CRYSTAL-GROWTH
29Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
60characterised by shape
Applicants
  • PURDUE RESEARCH FOUNDATION [US]/[US]
Inventors
  • WU, Wenzhuo
  • WANG, Yixiu
Agents
  • RAO, Zhigang
Priority Data
16/685,11415.11.2019US
62/776,04606.12.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SUBSTRATE-FREE CRYSTALLINE 2D BISMUTHENE
(FR) BISMUTHÈNE 2D CRISTALLIN EXEMPT DE SUBSTRAT
Abstract
(EN)
The present disclosure generally relates to compositions comprising substrate-free crystalline 2D bismuthene, and the method of making and using the substrate-free crystalline 2D bismuthene. The substrate-free 2D bismuthene disclosed in the present disclosure provides a standalone, stable and convenient source of pure 2D bismuthene. One specific substrate-free crystalline 2D bismuthene nanoflakes that are characterized by an X-ray diffraction pattern (CuKα radiation, λ=1.54056 A) comprising a peak at 26.16 (2θ ± 0.1°), and optionally one or more peaks selected from the group consisting of 36.99, 38.64, 47.67, and 55.14 (2θ ± 0.1°).
(FR)
La présente invention concerne, d'une manière générale, des compositions comprenant du bismuthène cristallin 2D exempt de substrat, et le procédé de fabrication et d'utilisation du bismuthène 2D cristallin exempt de substrat. La présente invention concerne en outre une source autonome, stable et pratique de bismuthène 2D pur. Un type de nanoflocon de bismuthène 2D cristallin exempt de substrat spécifiques est caractérisé par un spectre de diffraction des rayons X (rayonnement CuKα, lambda = 1,54056 A) comprenant un pic à 26,16 (2θ ± 0,1°), et éventuellement un ou plusieurs pics choisis dans le groupe constitué de 36,99, 38,64, 47,67 et 55,14 (2θ ± 0,1°).
Also published as
Latest bibliographic data on file with the International Bureau