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1. WO2020116279 - INSPECTION ASSISTANCE DEVICE AND METHOD FOR STRUCTURE

Publication Number WO/2020/116279
Publication Date 11.06.2020
International Application No. PCT/JP2019/046364
International Filing Date 27.11.2019
IPC
E04G 23/00 2006.01
EFIXED CONSTRUCTIONS
04BUILDING
GSCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR OTHER BUILDING AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
23Working measures on existing buildings
G01N 21/88 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws, defects or contamination
CPC
E04G 23/00
EFIXED CONSTRUCTIONS
04BUILDING
GSCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR OTHER BUILDING AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
23Working measures on existing buildings,
G01N 21/88
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
Applicants
  • 富士フイルム株式会社 FUJIFILM CORPORATION [JP]/[JP]
Inventors
  • 松本 一磨 MATSUMOTO, Kazuma
Agents
  • 松浦 憲三 MATSUURA, Kenzo
Priority Data
2018-22826805.12.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) INSPECTION ASSISTANCE DEVICE AND METHOD FOR STRUCTURE
(FR) DISPOSITIF ET PROCÉDÉ D'AIDE À L'INSPECTION POUR STRUCTURE
(JA) 構造物の点検支援装置及び方法
Abstract
(EN)
Provided are an inspection assistance device and method for a structure, the device and method enabling automatic detection of an event caused by damage and the damage causing the event and enabling reduction in burden of inspection of a structure. This device is provided with: an image acquisition unit which acquires an image captured of a structure to be inspected; a detector (52) which has undergone machine learning and which detects damage in a structure and an event induced by the damage by using the image acquired by the image acquisition unit as an input image (34); and an output unit (60) which outputs a detection result by the detector (52).
(FR)
La présente invention concerne un dispositif et un procédé d'aide à l'inspection pour une structure, le dispositif et le procédé permettant la détection automatique d'un événement provoqué par un dommage et du dommage provoquant l'événement et permettant la réduction de la charge d'inspection d'une structure. Ce dispositif comprend : une unité d'acquisition d'image qui acquiert une image capturée d'une structure devant être inspectée ; un détecteur (52) qui a subi un apprentissage machine et qui détecte un dommage dans une structure et un événement induit par le dommage en utilisant l'image acquise par l'unité d'acquisition d'image comme une image d'entrée (34) ; et une unité de sortie (60) qui délivre un résultat de détection par le détecteur (52).
(JA)
損傷が原因で起こる事象とその事象の原因となる損傷を自動で検出し、構造物の点検の負担を低減することができる構造物の点検支援装置及び方法を提供する。点検対象の構造物を撮影した画像を取得する画像取得部と、機械学習済みの検出器(52)であって、画像取得部が取得した画像を入力画像(34)とし、構造物の損傷及び損傷が原因で起こる事象を検出する検出器(52)と、検出器(52)による検出結果を出力する出力部(60)と、を備える。
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