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1. WO2020116236 - INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION DEVICE PROGRAM

Publication Number WO/2020/116236
Publication Date 11.06.2020
International Application No. PCT/JP2019/046137
International Filing Date 26.11.2019
IPC
G01R 19/00 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
19Arrangements for measuring currents or voltages or for indicating presence or sign thereof
G01R 31/50 2020.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
G01R 31/319 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuits
Applicants
  • 日本電産リード株式会社 NIDEC-READ CORPORATION [JP]/[JP]
Inventors
  • 栗原 靖人 KURIHARA Yasuhito
Agents
  • 柳野 隆生 YANAGINO Takao
  • 柳野 嘉秀 YANAGINO Yoshihide
  • 森岡 則夫 MORIOKA Norio
  • 関口 久由 SEKIGUCHI Hisayoshi
  • 大西 裕人 OHNISHI Hiroto
Priority Data
2018-22874906.12.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION DEVICE PROGRAM
(FR) DISPOSITIF D'INSPECTION, PROCÉDÉ D'INSPECTION ET PROGRAMME DE DISPOSITIF D'INSPECTION
(JA) 検査装置、検査方法、及び検査装置用プログラム
Abstract
(EN)
Provided is an inspection method for inspecting a portion A to be inspected in which a plurality of current paths A1, A2 having diode characteristics are connected in parallel. The inspection method comprises a measuring process step in which, while allowing a current with a preset first current value Ia to flow between the ends of the portion A to be inspected, a voltage across the ends is measured as a first voltage value Va, wherein the first current value Ia is smaller than or equal to a current value at which the voltage across the ends of the portion A to be inspected, when normal, substantially becomes an on-voltage Von.
(FR)
L'invention concerne un procédé d'inspection permettant d'inspecter une partie A à inspecter dans laquelle une pluralité de trajets de courant (A1, A2) présentant des caractéristiques de diode sont connectés en parallèle. Le procédé d'inspection comprend une étape de traitement de mesure dans laquelle, tout en permettant à un courant présentant une première valeur de courant prédéfinie Ia de circuler entre les extrémités de la partie A à inspecter, une tension aux bornes est mesurée en tant que première valeur de tension Va, la première valeur de courant Ia étant inférieure ou égale à une valeur de courant à laquelle la tension aux bornes de la partie A à inspecter, lorsqu'elle est normale, devient sensiblement une tension de mise en marche.
(JA)
ダイオード特性を有する複数の電流経路A1,A2が並列接続された検査対象部Aの検査を行う検査方法であって、予め設定された第一電流値Iaの電流を前記両端間に流しつつ、前記両端間の電圧を第一電圧値Vaとして測定する測定処理工程を含み、第一電流値Iaは、正常な検査対象部Aの両端間の電圧が実質的にオン電圧Vonになる電流値以下である。
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