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1. WO2020113894 - ELECTRICAL TESTING DEVICE AND METHOD FOR ACCURATELY LOCATING CROSS LINE DEFECT OF ELECTRICAL TESTING DEVICE

Publication Number WO/2020/113894
Publication Date 11.06.2020
International Application No. PCT/CN2019/084099
International Filing Date 24.04.2019
IPC
G09G 3/00 2006.01
GPHYSICS
09EDUCATING; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
3Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
G02F 1/1362 2006.01
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
1362Active matrix addressed cells
CPC
G02F 1/1362
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour 
13based on liquid crystals, e.g. single liquid crystal display cells
133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
1362Active matrix addressed cells
G02F 2001/136254
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour 
13based on liquid crystals, e.g. single liquid crystal display cells
133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
1362Active matrix addressed cells
136254Checking; Testing
G09G 3/006
GPHYSICS
09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
3Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Applicants
  • 深圳市华星光电半导体显示技术有限公司 SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD. [CN]/[CN]
Inventors
  • 刘强 LIU, Qiang
Agents
  • 深圳市德力知识产权代理事务所 COMIPS INTELLECTUAL PROPERTY OFFICE
Priority Data
201811475446.404.12.2018CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) ELECTRICAL TESTING DEVICE AND METHOD FOR ACCURATELY LOCATING CROSS LINE DEFECT OF ELECTRICAL TESTING DEVICE
(FR) DISPOSITIF DE TEST ÉLECTRIQUE ET PROCÉDÉ DE LOCALISATION PRÉCISE D'UN DÉFAUT DE LIGNE CROISÉE D'UN DISPOSITIF DE TEST ÉLECTRIQUE
(ZH) 电性测试设备及电性测试设备十字线缺陷精确定位方法
Abstract
(EN)
An electrical testing device and a method for accurately locating a cross line defect of an electrical testing device. The method comprises: step 10, adding an infrared probe to an electrical testing device; step 20, using the electrical testing device to apply electrical power to an array substrate; and step 30, detecting, by means of the infrared probe, a location in the array substrate where heat has been generated due to a cross line defect, so as to locate the cross line defect at the array substrate. Further provided is an electrical testing device. The device and the method can accurately locate a cross line defect at an array substrate, thereby improving repair efficiency and product yields.
(FR)
L'invention concerne un dispositif de test électrique et un procédé de localisation précise d'un défaut de ligne croisée d'un dispositif de test électrique. Le procédé comporte: à l'étape 10, l'ajout d'une sonde infrarouge à un dispositif de test électrique; à l'étape 20, l'utilisation du dispositif de test électrique pour appliquer une puissance électrique à un substrat de matrice; et à l'étape 30, la détection, au moyen de la sonde infrarouge, d'un emplacement dans le substrat de matrice où de la chaleur a été générée en raison d'un défaut de ligne croisée, de façon à localiser le défaut de ligne croisée dans le substrat de matrice. L'invention concerne en outre un dispositif de test électrique. Le dispositif et le procédé peuvent localiser précisément un défaut de ligne croisée dans un substrat de matrice, améliorant ainsi l'efficience des réparations et les rendements en produits.
(ZH)
一种电性测试设备及电性测试设备十字线缺陷精确定位方法,该方法包括:步骤10、在电性测试设备上加入红外探头;步骤20、利用电性测试设备向阵列基板加电;步骤30、通过红外探头侦测阵列基板内因十字线缺陷产生热量的位置,从而定位阵列基板上十字线缺陷的位置。还提供了一种电性测试设备。该设备和方法能够精确定位阵列基板上的十字线缺陷,进而提升修补效率和产品良率。
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