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1. WO2020113678 - TEST METHOD AND DEVICE OF ARRAY SUBSTRATE, AND STORAGE MEDIUM

Publication Number WO/2020/113678
Publication Date 11.06.2020
International Application No. PCT/CN2018/121889
International Filing Date 19.12.2018
IPC
G02F 1/13 2006.01
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
G01R 31/00 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
CPC
G09G 3/006
GPHYSICS
09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
3Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Applicants
  • 惠科股份有限公司 HKC CORPORATION LIMITED [CN]/[CN]
Inventors
  • 林佩欣 LIN, Peixin
Agents
  • 深圳市世纪恒程知识产权代理事务所 CENFO INTELLECTUAL PROPERTY AGENCY
Priority Data
201811483443.505.12.2018CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) TEST METHOD AND DEVICE OF ARRAY SUBSTRATE, AND STORAGE MEDIUM
(FR) PROCÉDÉ DE TEST ET DISPOSITIF DE SUBSTRAT DE RÉSEAU ET SUPPORT DE STOCKAGE
(ZH) 阵列基板的测试方法、装置及存储介质
Abstract
(EN)
A test method of an array substrate, comprising the following steps: sequentially exerting a curing driving signal on curing cushion circuits according to an arrangement sequence of the curing cushion circuits in a test circuit board, wherein the curing cushion circuits are connected to at least two array substrates; and performing an array test on the array substrates on the curing cushion circuits by means of the curing driving signal. Also provided are a test device of the array substrate, and a computer readable storage medium.
(FR)
La présente invention concerne un procédé de test d'un substrat de réseau, comprenant les étapes suivantes : l'application séquentielle d'un signal de commande de durcissement sur des circuits de coussin de durcissement selon une séquence d'agencement des circuits de coussin de durcissement dans une carte de circuit de test, les circuits de coussin de durcissement étant connectés à au moins deux substrats de réseau ; et la réalisation d'un test de réseau sur les substrats de réseau sur les circuits de coussin de durcissement au moyen du signal de commande de durcissement. L’invention concerne également un dispositif de test du substrat de réseau et un support de stockage lisible par ordinateur.
(ZH)
一种阵列基板的测试方法,包括以下步骤:根据固化垫电路在测试电路板中的排布顺序,依次对固化垫电路施加固化驱动信号,其中,固化垫电路连接有至少两块阵列基板;以及通过固化驱动信号对固化垫电路中的阵列基板进行阵列测试。还提供了一种阵列基板的测试装置以及计算机可读存储介质。
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