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1. WO2020111075 - PROBE UNIT

Publication Number WO/2020/111075
Publication Date 04.06.2020
International Application No. PCT/JP2019/046234
International Filing Date 26.11.2019
IPC
G01R 1/067 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
G01R 1/073 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
G01R 31/26 2020.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
H01R 33/76 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
33Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
74Devices having four or more poles
76Holders with sockets, clips or analogous contacts, adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
CPC
G01R 1/067
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
G01R 1/073
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
G01R 31/26
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
H01R 33/76
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
33Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
74Devices having four or more poles ; , e.g. holders for compact fluorescent lamps
76Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
Applicants
  • 日本発條株式会社 NHK SPRING CO., LTD. [JP]/[JP]
Inventors
  • 井沼 毅 INUMA, Tsuyoshi
  • 高橋 秀志 TAKAHASHI, Shuji
Agents
  • 特許業務法人酒井国際特許事務所 SAKAI INTERNATIONAL PATENT OFFICE
Priority Data
2018-22149327.11.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) PROBE UNIT
(FR) UNITÉ DE SONDE
(JA) プローブユニット
Abstract
(EN)
This probe unit comprises: a first contact probe in contact with a signal electrode; a second contact probe in contact with a ground electrode; a probe holder having formed therein a first holder hole that penetrates the first contact probe and a second holder hole that penetrates the second contact probe; and a conductive floating that has a first through-hole and a second through-hole formed therein, said first through-hole having one end of the first contact probe inserted from one end side thereof and a contact-target electrode inserted from the other end side thereof, and said second through-hole having one end of the second contact probe inserted from one end side thereof and the ground electrode inserted from the other end side. The probe unit has a coaxial structure whereby the center axis of the first contact probe and the center axis of the first through-hole of the floating match.
(FR)
L'invention concerne une unité de sonde comprenant : une première sonde de contact en contact avec une électrode de signal ; une seconde sonde de contact en contact avec une électrode de masse ; un support de sonde dans lequel est formé un premier trou de support qui pénètre dans la première sonde de contact et un second trou de support qui pénètre dans la seconde sonde de contact ; et un flotteur conducteur possédant un premier trou traversant et un second trou traversant formé en son sein, ledit premier trou traversant présentant une extrémité de la première sonde de contact insérée depuis un côté d'extrémité et une électrode de cible de contact insérée depuis son autre côté d'extrémité, et ledit second trou traversant présentant une extrémité de la seconde sonde de contact insérée depuis un côté d'extrémité et l'électrode de masse insérée depuis son autre côté d'extrémité. L'unité de sonde présente une structure coaxiale grâce à laquelle l'axe central de la première sonde de contact et l'axe central du premier trou traversant du flotteur correspondent l'un à l'autre.
(JA)
本発明にかかるプローブユニットは、信号用の電極と接触する第1のコンタクトプローブと、グランド用の電極と接触する第2のコンタクトプローブと、第1のコンタクトプローブを挿通する第1ホルダ孔と、第2のコンタクトプローブを挿通する第2ホルダ孔とが形成されたプローブホルダと、一端側から第1のコンタクトプローブの一方の端部が挿入され、他端側から接触対象の電極が挿入される第1貫通孔と、一端側から第2のコンタクトプローブの一方の端部が挿入され、他端側からグランド用の電極が挿入される第2貫通孔とが形成された導電性のフローティングと、を備え、第1のコンタクトプローブの中心軸と、フローティングの第1貫通孔の中心軸とが一致した同軸構造をなす。
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