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1. WO2020110532 - THICKNESS MEASUREMENT DEVICE AND THICKNESS MEASUREMENT METHOD

Publication Number WO/2020/110532
Publication Date 04.06.2020
International Application No. PCT/JP2019/041692
International Filing Date 24.10.2019
IPC
G01B 11/06 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
02for measuring length, width, or thickness
06for measuring thickness
B65H 5/08 2006.01
BPERFORMING OPERATIONS; TRANSPORTING
65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
5Feeding articles separated from piles; Feeding articles to machines
08by grippers, e.g. suction grippers
CPC
B65H 5/08
BPERFORMING OPERATIONS; TRANSPORTING
65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
5Feeding articles separated from piles; Feeding articles to machines
08by grippers, e.g. suction grippers
G01B 11/06
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
02for measuring length, width or thickness
06for measuring thickness, e.g. of sheet material
Applicants
  • 三菱電機株式会社 MITSUBISHI ELECTRIC CORPORATION [JP]/[JP]
Inventors
  • 馬場 敏通 BABA, Toshimichi
  • 徳 幸博 TOKU, Yukihiro
  • 山井 祐作 YAMAI, Yusaku
Agents
  • 特許業務法人深見特許事務所 FUKAMI PATENT OFFICE, P.C.
Priority Data
2018-22219728.11.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) THICKNESS MEASUREMENT DEVICE AND THICKNESS MEASUREMENT METHOD
(FR) DISPOSITIF ET PROCÉDÉ DE MESURE D'ÉPAISSEUR
(JA) 厚み測定装置および厚み測定方法
Abstract
(EN)
Provided are a thickness measurement device and a thickness measurement method, whereby the thickness of a layered measurement object can be detected accurately without contact even when the thickness is small. A thickness measurement device (100) is provided with a retaining conveyance mechanism part (1) and a thickness measurement mechanism part (2). The retaining conveyance mechanism part (1) includes a retaining member (11) comprising a rigid material in contact with a measurement object (9), an elastic member (12) in contact with the retaining member (11), and a joint member (10) comprising a rigid material in contact with the reverse side of the elastic member (12) from the retaining member (11). The thickness measurement mechanism part (2) includes a base member (20) comprising a rigid material which faces the retaining member (11) and is capable of clamping the measurement object (9) between the base member (20) and the retaining member (11).
(FR)
L'invention concerne un dispositif et un procédé de mesure d'épaisseur, l'épaisseur d'un objet stratifié à mesurer pouvant être détectée avec précision sans contact même lorsque l'épaisseur est faible. Un dispositif de mesure d'épaisseur (100) est pourvu d'une partie mécanisme de transport de retenue (1) et d'une partie mécanisme de mesure d'épaisseur (2). La partie mécanisme de transport de retenue (1) comprend un élément de retenue (11) comprenant un matériau rigide en contact avec un objet à mesurer (9), un élément élastique (12) en contact avec l'élément de retenue (11), et un élément de joint (10) comprenant un matériau rigide en contact avec le côté inverse de l'élément élastique (12) à partir de l'élément de retenue (11). La partie de mécanisme de mesure d'épaisseur (2) comprend un élément de base (20) constitué d'un matériau rigide qui fait face à l'élément de retenue (11) et est apte à serrer l'objet à mesurer (9) entre l'élément de base (20) et l'élément de retenue (11).
(JA)
積層された測定対象物の厚みが薄い場合であっても、非接触にて正確な厚みを検出できる厚み測定装置および厚み測定方法を提供する。厚み測定装置(100)は、保持搬送機構部(1)と、厚み測定機構部(2)とを備える。保持搬送機構部(1)は、測定対象物(9)に接する剛体材料からなる保持部材(11)と、保持部材(11)に接する弾性体部材(12)と、弾性体部材(12)の保持部材(11)と反対側に接する剛体材料からなる継手部材(10)とを含む。厚み測定機構部(2)は、保持部材(11)に対向し保持部材(11)との間に測定対象物(9)を挟持可能な剛体材料からなるベース部材(20)を含む。
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