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1. WO2020110070 - METHOD OF IDENTIFYING A STRUCTURE

Publication Number WO/2020/110070
Publication Date 04.06.2020
International Application No. PCT/IB2019/060307
International Filing Date 29.11.2019
IPC
G01N 21/552 2014.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
55Specular reflectivity
552Attenuated total reflection
G02B 5/00 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5Optical elements other than lenses
G02B 21/34 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
34Microscope slides, e.g. mounting specimens on microscope slides
B82Y 15/00 2011.01
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE  OR TREATMENT OF NANOSTRUCTURES
15Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
CPC
B82Y 20/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
20Nanooptics, e.g. quantum optics or photonic crystals
G01N 21/255
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
255Details, e.g. use of specially adapted sources, lighting or optical systems
G01N 21/553
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
55Specular reflectivity
552Attenuated total reflection
553and using surface plasmons
G02B 5/008
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5Optical elements other than lenses
008Surface plasmon devices
Applicants
  • LA TROBE UNIVERSITY [AU]/[AU]
Inventors
  • ABBEY, Brian
  • BALAUR, Eugeniu
Agents
  • FPA PATENT ATTORNEYS PTY LTD
Priority Data
201890455229.11.2018AU
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) METHOD OF IDENTIFYING A STRUCTURE
(FR) PROCÉDÉ D'IDENTIFICATION D'UNE STRUCTURE
Abstract
(EN)
A method of analysis of a sample is described. The method includes providing a sample holder having an upper surface and a lower surface, the upper surface having a plasmonic layer associated therewith, the plasmonic layer including a periodic array of sub-micron structures. A sample is applied to the sample holder and illuminated. At least one localised structural property of the sample is visible in an image formed based on the colour of the received light. The method includes using the image formed to control a subsequent analysis process. The subsequent analysis process can be another microscopy process such as TEM, SEM or the like.
(FR)
L'invention concerne un procédé d'analyse d'un échantillon. Le procédé comprend la fourniture d'un porte-échantillon ayant une surface supérieure et une surface inférieure, une couche plasmonique étant associée à la surface supérieure, la couche plasmonique comprenant un réseau périodique de structures submicroniques. Un échantillon est appliqué au porte-échantillon et éclairé. Au moins une propriété structurale localisée de l'échantillon est visible sur une image formée sur la base de la couleur de la lumière reçue. Le procédé comprend l'utilisation de l'image formée pour commander un processus d'analyse ultérieur. Le processus d'analyse ultérieur peut être un autre procédé de microscopie tel que MET, MEB ou similaire.
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