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1. WO2020110069 - MICROSCOPY METHOD AND SYSTEM

Publication Number WO/2020/110069
Publication Date 04.06.2020
International Application No. PCT/IB2019/060305
International Filing Date 29.11.2019
IPC
G02B 21/34 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
34Microscope slides, e.g. mounting specimens on microscope slides
G01N 21/552 2014.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
55Specular reflectivity
552Attenuated total reflection
B82Y 15/00 2011.01
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE  OR TREATMENT OF NANOSTRUCTURES
15Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
B82Y 20/00 2011.01
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE  OR TREATMENT OF NANOSTRUCTURES
20Nanooptics, e.g. quantum optics or photonic crystals
CPC
G01N 2021/258
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
258Surface plasmon spectroscopy, e.g. micro- or nanoparticles in suspension
G01N 21/255
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
255Details, e.g. use of specially adapted sources, lighting or optical systems
G01N 21/553
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
55Specular reflectivity
552Attenuated total reflection
553and using surface plasmons
G02B 21/34
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
34Microscope slides, e.g. mounting specimens on microscope slides
G02B 5/008
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5Optical elements other than lenses
008Surface plasmon devices
Applicants
  • LA TROBE UNIVERSITY [AU]/[AU]
Inventors
  • ABBEY, Brian
  • BALAUR, Eugeniu
Agents
  • FPA PATENT ATTORNEYS PTY LTD
Priority Data
201890455329.11.2018AU
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) MICROSCOPY METHOD AND SYSTEM
(FR) PROCÉDÉ ET SYSTÈME DE MICROSCOPIE
Abstract
(EN)
A sample holder for use in an optical microscope is disclosed. The sample holder includes a plasmonic layer defining a periodic array of sub-micron structures wherein the periodic array of sub-micron structures comprise an array of separated plasmonic regions. The regions may be a circle, a torus, an ellipse, a cross, rectangle, square, line, strip. Methods of performing reflection and fluorescence microscopy using such a sample holder and other sample holders are also disclosed.
(FR)
L'invention concerne un porte-échantillon destiné à être utilisé dans un microscope optique. Le porte-échantillon comprend une couche plasmonique définissant un réseau périodique de structures submicroniques, le réseau périodique de structures submicroniques comprenant un réseau de régions plasmoniques séparées. Les régions peuvent être un cercle, un tore, une ellipse, une croix, un rectangle, un carré, une ligne, une bande. L'invention concerne également des procédés de réalisation de microscopie à réflexion et à fluorescence utilisant un tel porte-échantillon et d'autres porte-échantillons.
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