Processing

Please wait...

Settings

Settings

Goto Application

1. WO2020096774 - HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAMINATIONS AND RELATED SYSTEMS, METHODS, AND DEVICES

Publication Number WO/2020/096774
Publication Date 14.05.2020
International Application No. PCT/US2019/057624
International Filing Date 23.10.2019
IPC
G01N 21/17 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
G01J 3/28 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
G01J 4/04 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
4Measuring polarisation of light
04Polarimeters using electric detection means
G01N 21/25 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
G01S 17/02 2020.01
GPHYSICS
01MEASURING; TESTING
SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
17Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
02Systems using the reflection of electromagnetic waves other than radio waves
G06F 17/18 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
17Digital computing or data processing equipment or methods, specially adapted for specific functions
10Complex mathematical operations
18for evaluating statistical data
Applicants
  • BATTELLE ENERGY ALLIANCE, LLC [US]/[US]
Inventors
  • AGUIAR, Jeffery A.
Agents
  • BOOTH, Brett C.
  • BEZDJIAN, Daniel J.
  • FLORES, Jesse M.
  • GUNN, J. Jeffrey
  • HAMER, Katherine A.
  • SCHIERMAN, Elizabeth Herbst
  • WALKOWSKI, Joseph A.
  • WATSON, James C.
  • WOODHOUSE, Kyle M.
Priority Data
62/755,93205.11.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAMINATIONS AND RELATED SYSTEMS, METHODS, AND DEVICES
(FR) MICROSCOPIE ÉLECTRONIQUE EN TRANSMISSION À BALAYAGE HYPERDIMENSIONNELLE ET EXAMENS ET SYSTÈMES, PROCÉDÉS ET DISPOSITIFS ASSOCIÉS
Abstract
(EN)
A material identification system includes one or more data interfaces configured to receive first sensor data generated by a first sensor responsive to a material sample, and receive second sensor data generated by a second sensor responsive to the material sample. The material identification system also includes one or more processors configured to generate a set of predictions of an identification of the material sample and a corresponding set of certainty information.
(FR)
Système d'identification de matériau comprenant une ou plusieurs interfaces de données configurées pour recevoir des premières données de capteur générées par un premier capteur réagissant à un échantillon de matériau, et recevoir des secondes données de capteur générées par un second capteur réagissant à l'échantillon de matériau. Le système d'identification de matériau comprend également un ou plusieurs processeurs configurés pour générer un ensemble de prédictions pour l'identification de l'échantillon de matériau et d'un ensemble correspondant d'informations de fiabilité.
Latest bibliographic data on file with the International Bureau