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1. WO2020089751 - ELECTRON DIFFRACTION IMAGING SYSTEM FOR DETERMINING MOLECULAR STRUCTURE AND CONFORMATION

Publication Number WO/2020/089751
Publication Date 07.05.2020
International Application No. PCT/IB2019/059152
International Filing Date 24.10.2019
IPC
G01N 23/20058 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20058Measuring diffraction of electrons, e.g. low energy electron diffraction method or reflection high energy electron diffraction method
G01N 23/20008 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
CPC
G01N 2223/0565
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
05by diffraction, scatter or reflection
056diffraction
0565diffraction of electrons, e.g. LEED
G01N 2223/102
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
10Different kinds of radiation or particles
102beta or electrons
G01N 2223/309
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
309support of sample holder
G01N 2223/316
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
316collimators
G01N 2223/32
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
32adjustments of elements during operation
G01N 2223/3301
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
33scanning, i.e. relative motion for measurement of successive object-parts
3301beam is modified for scan, e.g. moving collimator
Applicants
  • BRUKER AXS GMBH [DE]/[DE]
Inventors
  • DURST, Roger D.
  • OLLINGER, Christoph
Agents
  • KRAMER, Matthias
Priority Data
16/176,63931.10.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) ELECTRON DIFFRACTION IMAGING SYSTEM FOR DETERMINING MOLECULAR STRUCTURE AND CONFORMATION
(FR) SYSTÈME D'IMAGERIE PAR DIFFRACTION D'ÉLECTRONS POUR DÉTERMINER UNE STRUCTURE MOLÉCULAIRE ET UNE CONFORMATION
Abstract
(EN)
An electron diffraction imaging system for imaging the three-dimensional structure of a single target molecule of a sample uses an electron source that emits a beam of electrons toward the sample, and a two-dimensional detector that detects electrons diffracted by the sample and generates an output indicative of their spatial distribution. A sample support is transparent to electrons in a region in which the sample is located, and is rotatable and translatable in at least two perpendicular directions. The electron beam has an operating energy between 5 keV and 30 keV, and beam optics block highly divergent electrons to limit the beam diameter to no more than three times the size of the sample molecule and provide a lateral coherence length of at least 15 nm. An adjustment system adjusts the sample support position in response to the detector output to center the target molecule in the beam.
(FR)
L'invention concerne un système d'imagerie par diffraction d'électrons destiné à capturer l'image de la structure tridimensionnelle d'une molécule cible unique d'un échantillon, le système utilisant une source d'électrons qui émet un faisceau d'électrons vers l'échantillon et un détecteur bidimensionnel qui détecte des électrons diffractés par l'échantillon et génère une sortie indicative de leur distribution spatiale. Un support d'échantillon est transparent aux électrons dans une région dans laquelle est situé l'échantillon et peut être mis en rotation et effectuer une translation dans au moins deux directions perpendiculaires. Le faisceau d'électrons présente une énergie de fonctionnement comprise entre 5 keV et 30 keV, et des optiques de faisceau bloquent des électrons fortement divergents pour limiter le diamètre du faisceau à un maximum de trois fois la taille de la molécule d'échantillon et fournir une longueur de cohérence latérale d'au moins 15 nm. Un système de réglage ajuste la position du support d'échantillon en réponse à la sortie du détecteur pour centrer la molécule cible dans le faisceau.
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