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1. WO2020068954 - MILLIMETER WAVE ACTIVE LOAD PULL USING LOW FREQUENCY PHASE AND AMPLITUDE TUNING

Publication Number WO/2020/068954
Publication Date 02.04.2020
International Application No. PCT/US2019/052918
International Filing Date 25.09.2019
IPC
G01R 27/32 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
28Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response
32in circuits having distributed constants
CPC
G01R 27/32
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks ; using network analysers; Measuring transient response
32in circuits having distributed constants ; , e.g. having very long conductors or involving high frequencies
G01R 31/2822
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
2822of microwave or radiofrequency circuits
G01R 31/31709
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
31708Analysis of signal quality
31709Jitter measurements; Jitter generators
G01R 31/31937
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuit
3193with comparison between actual response and known fault free response
31937Timing aspects, e.g. measuring propagation delay
Applicants
  • MAURY MICROWAVE, INC. [US]/[US]
Inventors
  • ESPOSITO, Giampiero
  • MARCHETTI, Mauro
  • PADMANABHAN, Sathya
  • SIMPSON, Gary, R.
Agents
  • ROBERTS, Larry, K.
Priority Data
16/580,55324.09.2019US
62/739,00328.09.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) MILLIMETER WAVE ACTIVE LOAD PULL USING LOW FREQUENCY PHASE AND AMPLITUDE TUNING
(FR) VARIATION DE CHARGE (LOAD PULL) ACTIVE À ONDES MILLIMÉTRIQUES Á L'AIDE D'UN ACCORD DE PHASE ET D'AMPLITUDE BASSE FRÉQUENCE
Abstract
(EN)
A load pull system for making measurements on a OUT at millimeter wave frequencies using active tuning. The system uses phase and amplitude control (2, 2A, 3, 3A, 9, 9A) of each signal at low frequency before being up-converted (7, 7A) to the millimeter wave measurement frequencies. The measured signals at the OUT plane may be downconverted (9, 9A) for measurement with a low frequency analyzer.
(FR)
L'invention concerne un système de variation de charge (load pull) pour effectuer des mesures sur un DUT à des fréquences d'ondes millimétriques à l'aide d'un accord actif. Le système utilise une commande de phase et d'amplitude (2, 2A, 3, 3A, 9, 9A) de chaque signal basse fréquence avant conversion ascendante (7, 7A) aux fréquences de mesure d'ondes millimétriques. Les signaux mesurés au niveau du plan de DUT peuvent être convertis de façon descendante pour une mesure avec un analyseur basse fréquence.
Also published as
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