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1. WO2020067114 - NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEUTRON RADIATION METHOD

Publication Number WO/2020/067114
Publication Date 02.04.2020
International Application No. PCT/JP2019/037500
International Filing Date 25.09.2019
IPC
G01N 23/204 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
203Measuring back scattering
204using neutrons
G01N 23/09 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
06and measuring the absorption
09the radiation being neutrons
G01N 23/18 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
06and measuring the absorption
18Investigating the presence of defects or foreign matter
G01N 23/20008 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G21K 1/093 2006.01
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
1Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
08Deviation, concentration, or focusing of the beam by electric or magnetic means
093by magnetic means
G21K 5/02 2006.01
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
5Irradiation devices
02having no beam-forming means
CPC
G01N 23/05
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
02by transmitting the radiation through the material
04and forming images of the material
05using neutrons
G01N 23/09
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
02by transmitting the radiation through the material
06and measuring the absorption
09the radiation being neutrons
G01N 23/18
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
02by transmitting the radiation through the material
06and measuring the absorption
18Investigating the presence of flaws defects or foreign matter
G01N 23/20008
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G01N 23/204
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
203Measuring back scattering
204using neutrons
G21K 1/093
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
1Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
08Deviation, concentration or focusing of the beam by electric or magnetic means
093by magnetic means
Applicants
  • 株式会社トプコン TOPCON CORPORATION [JP]/[JP]
  • 国立研究開発法人理化学研究所 RIKEN [JP]/[JP]
Inventors
  • 永野 繁憲 NAGANO Shigenori
  • 塚田 央 TSUKADA Hisashi
  • 大竹 淑恵 OTAKE Yoshie
  • 井門 孝治 IKADO Koji
  • 吉村 雄一 YOSHIMURA Yuichi
  • 須長 秀行 SUNAGA Hideyuki
Agents
  • 前川 直輝 MAEKAWA Naoki
Priority Data
2018-18281327.09.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEUTRON RADIATION METHOD
(FR) SYSTÈME D'INSPECTION NON DESTRUCTIVE, SOURCE DE RAYONNEMENT DE NEUTRONS ET PROCÉDÉ DE RAYONNEMENT DE NEUTRONS
(JA) 非破壊検査システム、中性子照射源及び中性子照射方法
Abstract
(EN)
A nondestructive inspecting system (1) is provided with a neutron radiation source (3) capable of radiating neutrons (N), and a neutron detecting unit (14) capable of detecting neutrons (Nb) that have been radiated from the neutron radiation source (3) and have passed through an object (6a) being inspected, wherein the neutron radiation source (3) is provided with: a linear accelerator (11) capable of emitting accelerated charged particles (P); a first magnet unit (12) which includes opposing magnets, and which is capable of causing deflection in a direction substantially perpendicular to an emission direction of the charged particles (P) emitted from the linear accelerator (11); and a target unit (13) which is irradiated by the charged particles (P) that have passed through the first magnet unit (12), and which is capable of generating the neutrons (N).
(FR)
La présente invention concerne un système d'inspection non destructive (1) qui est pourvu d'une source de rayonnement de neutrons (3) qui peut émettre des neutrons (N), et d'une unité de détection de neutrons (14) qui peut détecter des neutrons (Nb) qui ont été émis à partir de la source de rayonnement de neutrons (3) et qui ont traversé un objet (6a) qui est inspecté, la source de rayonnement de neutrons (3) étant pourvue : d'un accélérateur linéaire (11) qui peut émettre des particules chargées accélérées (P) ; d'une première unité d'aimant (12) qui comprend des aimants opposés, et qui peut provoquer une déviation dans une direction sensiblement perpendiculaire à une direction d'émission des particules chargées (P) émises à partir de l'accélérateur linéaire (11) ; et d'une unité cible (13) qui est irradiée par les particules chargées (P) qui ont traversé la première unité d'aimant (12), et qui peut générer les neutrons (N).
(JA)
非破壊検査システム(1)は、中性子(N)を照射可能な中性子照射源(3)と、中性子照射源(3)から照射され被検査物(6a)を介した中性子(Nb)を検出可能な中性子検出部(14)と、を備え、中性子照射源(3)は、加速された荷電粒子(P)を出射可能な線形加速器(11)と、線形加速器(11)から出射された荷電粒子(P)の出射方向に対して略垂直方向に偏向可能な、対向する磁石を有する第1の磁石部(12)と、第1の磁石部(12)を通過した荷電粒子(P)が照射され中性子(N)を発生可能なターゲット部(13)と、を備える。
Also published as
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