Processing

Please wait...

Settings

Settings

Goto Application

1. WO2020066828 - MEASUREMENT DEVICE AND MEASUREMENT METHOD

Publication Number WO/2020/066828
Publication Date 02.04.2020
International Application No. PCT/JP2019/036732
International Filing Date 19.09.2019
IPC
G01R 27/26 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants
G01N 27/00 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
G01R 29/12 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
29Arrangements for measuring or indicating electric quantities not covered by groups G01R19/-G01R27/135
12Measuring electrostatic fields
CPC
G01N 27/00
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
G01R 27/26
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; ; Measuring impedance or related variables
G01R 29/12
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
29Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
12Measuring electrostatic fields ; or voltage-potential
Applicants
  • 横河電機株式会社 YOKOGAWA ELECTRIC CORPORATION [JP]/[JP]
  • 学校法人法政大学 HOSEI UNIVERSITY [JP]/[JP]
Inventors
  • 勝山 純 KATSUYAMA Jun
  • 松本 憲典 MATSUMOTO Yoshinori
  • 品川 満 SHINAGAWA Mitsuru
Agents
  • 棚井 澄雄 TANAI Sumio
  • 佐伯 義文 SAEKI Yoshifumi
  • 高橋 久典 TAKAHASHI Hisanori
  • 沖田 壮男 OKITA Takeo
Priority Data
2018-18087426.09.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) MEASUREMENT DEVICE AND MEASUREMENT METHOD
(FR) DISPOSITIF DE MESURE ET PROCÉDÉ DE MESURE
(JA) 測定装置、および測定方法
Abstract
(EN)
This measurement device comprises: an electric field generation unit for generating an AC electric field, an electric field detection unit that is disposed at a distance from the electric field generation unit so as to oppose the same and is for detecting the AC electric field generated by the electric field generation unit, a thickness gauge for measuring the thickness of an object of measurement without touching the same, and a processing unit for deriving a calibration curve indicating the relationship between relative permittivity and the intensity of the AC electric field. The object of measurement can be inserted between the electric field generation unit and electric field detection unit. The electric field detection unit detects the intensity of the AC electric field that is attenuated by the object of measurement. The processing unit calculates the relative permittivity of the object of measurement on the basis of the intensity of the detected AC electric field, the measured thickness, and the derived calibration curve.
(FR)
La présente invention concerne un dispositif de mesure comprenant : une unité de génération de champ électrique servant à générer un champ électrique en CA, une unité de détection de champ électrique qui est disposée à une certaine distance de l'unité de génération de champ électrique de façon à s'opposer à celle-ci et qui sert à détecter le champ électrique en CA généré par l'unité de génération de champ électrique, une jauge d'épaisseur servant à mesurer l'épaisseur d'un objet de mesure sans le toucher, et une unité de traitement servant à obtenir une courbe d'étalonnage indiquant la relation entre la permittivité relative et l'intensité du champ électrique en CA. L'objet de mesure peut être inséré entre l'unité de génération de champ électrique et l'unité de détection de champ électrique. L'unité de détection de champ électrique détecte l'intensité du champ électrique en CA qui est atténué par l'objet de mesure. L'unité de traitement calcule la permittivité relative de l'objet de mesure sur la base de l'intensité du champ électrique en CA détecté, de l'épaisseur mesurée et de la courbe d'étalonnage obtenue.
(JA)
測定装置は、交流電界を発生する電界発生部と、前記電界発生部と距離を隔てて対向して配置され、且つ、前記電界発生部により発生された交流電界を検出する電界検出部と、測定対象物の厚さを非接触で測定する厚さ計と、比誘電率と交流電界の強度との間の関係を示す検量線の導出を行う処理部と、を備える、前記測定対象物は、前記電界発生部と前記電界検出部との間に挿入可能である。前記電界検出部は、前記測定対象物によって減衰した前記交流電界の強度を検出する。前記処理部は、検出された前記交流電界の強度と、測定された前記厚さと、導出された前記検量線とに基づいて、前記測定対象物の比誘電率を算出する。
Also published as
Latest bibliographic data on file with the International Bureau