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1. WO2020066168 - X-RAY GENERATION DEVICE AND X-RAY ANALYSIS DEVICE

Publication Number WO/2020/066168
Publication Date 02.04.2020
International Application No. PCT/JP2019/024573
International Filing Date 20.06.2019
IPC
H01J 35/08 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35X-ray tubes
02Details
04Electrodes
08Anodes; Anticathodes
G01N 23/201 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201Measuring small-angle scattering, e.g. small angle X-ray scattering
G01N 23/207 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
207Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G21K 5/02 2006.01
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
5Irradiation devices
02having no beam-forming means
H01J 35/10 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35X-ray tubes
02Details
04Electrodes
08Anodes; Anticathodes
10Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
H01J 35/14 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35X-ray tubes
02Details
14Arrangements for concentrating, focusing, or directing the cathode ray
CPC
G01N 23/201
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201by measuring small-angle scattering
G01N 23/207
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G21K 5/02
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
5Irradiation devices
02having no beam-forming means
H01J 35/08
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35X-ray tubes
02Details
04Electrodes ; ; Mutual position thereof; Constructional adaptations therefor
08Anodes; Anti cathodes
H01J 35/10
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35X-ray tubes
02Details
04Electrodes ; ; Mutual position thereof; Constructional adaptations therefor
08Anodes; Anti cathodes
10Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
H01J 35/14
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35X-ray tubes
02Details
14Arrangements for concentrating, focusing, or directing the cathode ray
Applicants
  • 株式会社リガク RIGAKU CORPORATION [JP]/[JP]
Inventors
  • 野々口 雅弘 NONOGUCHI, Masahiro
  • 影山 将史 KAGEYAMA, Masashi
Agents
  • 特許業務法人はるか国際特許事務所 HARUKA PATENT & TRADEMARK ATTORNEYS
Priority Data
2018-18038526.09.2018JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) X-RAY GENERATION DEVICE AND X-RAY ANALYSIS DEVICE
(FR) DISPOSITIF DE GÉNÉRATION DE RAYONS X ET DISPOSITIF D'ANALYSE DE RAYONS X
(JA) X線発生装置、及びX線分析装置
Abstract
(EN)
Provided are: an X-ray generation device that has a simple configuration and is capable of selectively generating X-rays having different wavelengths; and an X-ray analysis device. This X-ray generation device is provided with: an X-ray sealed tube including a cathode which emits thermoelectrons, and an anode which is irradiated with an electron beam obtained by the thermoelectrons being accelerated by an applied potential difference; a magnetic field generation unit which is disposed near the X-ray sealed tube so as to apply, to the electron beam, a magnetic field extending in a first direction intersecting with the traveling direction of the electron beam; and a rotational drive system which rotates the X-ray sealed tube about the center axis of the cathode and the anode, wherein on a surface of the anode, a first region is disposed on one side of a division line passing through the intersection between the surface and the center axis, and a second region is disposed on the other side, a first metal is disposed in the first region, and a second metal different from the first metal is disposed in the second region, and by the rotational drive system rotating the X-ray sealed tube, the X-ray sealed tube is disposed with respect to the magnetic field generation unit, when driven, so that the division line extends along the first direction.
(FR)
L'invention concerne : un dispositif de génération de rayons X qui a une configuration simple et est capable de générer sélectivement des rayons X ayant différentes longueurs d'onde ; et un dispositif d'analyse de rayons X. Ce dispositif de génération de rayons X comprend : un tube étanche aux rayons X comprenant une cathode qui émet des électrons thermiques, et une anode qui est irradiée avec un faisceau d'électrons obtenu par les électrons thermiques accélérés par une différence de potentiel appliquée ; une unité de génération de champ magnétique qui est disposée à proximité du tube étanche aux rayons X de façon à appliquer, au faisceau d'électrons, un champ magnétique s'étendant dans une première direction croisant la direction de déplacement du faisceau d'électrons ; et un système d'entraînement en rotation qui fait tourner le tube étanche aux rayons X autour de l'axe central de la cathode et de l'anode, sur une surface de l'anode, une première région est disposée sur un côté d'une ligne de division passant à travers l'intersection entre la surface et l'axe central, et une seconde région est disposée sur l'autre côté, un premier métal est disposé dans la première région, et un second métal différent du premier métal est disposé dans la seconde région, et par le système d'entraînement en rotation tournant le tube étanche aux rayons X, le tube étanche aux rayons X est disposé par rapport à l'unité de génération de champ magnétique, lorsqu'il est entraîné, de telle sorte que la ligne de division s'étend le long de la première direction.
(JA)
簡便な構成で異なる波長のX線を選択して発生させることが可能なX線発生装置、及びX線分析装置の提供。熱電子が放出される陰極と、印加される電位差により熱電子が加速され電子線となり照射される陽極と、を備える、X線封入管と、電子線の進行方向と交差する第1の方向に延伸する磁場を電子線に印加するよう、X線封入管の近傍に配置される、磁場発生部と、X線封入管を、陰極と陽極との中心軸に対して回転させる、回転駆動系と、を備える、X線発生装置であって、陽極の表面は、中心軸との交点を通る分割直線に対して、一方側に第1の領域が、他方側に第2の領域が、それぞれ配置され、第1の領域には第1の金属が、第2の領域には第1の金属とは異なる第2の金属が、それぞれ配置され、回転駆動系がX線封入管を回転させることにより、駆動時には、分割直線が第1の方向に沿うよう、X線封入管が磁場発生部に対して配置される。
Also published as
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