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1. WO2020065850 - THREE-DIMENSIONAL MEASURING DEVICE

Publication Number WO/2020/065850
Publication Date 02.04.2020
International Application No. PCT/JP2018/036029
International Filing Date 27.09.2018
IPC
G01B 11/24 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
G01B 11/25 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. moiré fringes, on the object
CPC
G01B 11/24
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
G01B 11/25
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. ; one or more lines,; moiré fringes on the object
Applicants
  • ヤマハ発動機株式会社 YAMAHA HATSUDOKI KABUSHIKI KAISHA [JP]/[JP]
Inventors
  • 田端 伸章 TABATA, Nobuaki
Agents
  • 宮園 博一 MIYAZONO, Hirokazu
Priority Data
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) THREE-DIMENSIONAL MEASURING DEVICE
(FR) DISPOSITIF DE MESURE TRIDIMENSIONNELLE
(JA) 3次元測定装置
Abstract
(EN)
Provided is an external appearance inspection device (100) (three-dimensional measuring device) comprising: a first measurement unit (30) that measures three-dimensional information by a phase-shift method; a second measurement unit (40) that measures three-dimensional information by an optical cutting method; and a control device (50) that acquires three-dimensional information for a measurement target on the basis of a measurement result for both of the first measurement unit and the second measurement unit.
(FR)
L'invention concerne un dispositif d'inspection d'apparence externe (100) (dispositif de mesure tridimensionnelle) comprenant : une première unité de mesure (30) qui mesure des informations tridimensionnelles par un procédé de déphasage ; une seconde unité de mesure (40) qui mesure des informations tridimensionnelles par un procédé de coupe optique ; et un dispositif de commande (50) qui acquiert des informations tridimensionnelles d'une cible de mesure en fonction d'un résultat de mesure de la première unité de mesure et de la seconde unité de mesure.
(JA)
この外観検査装置(100)(3次元測定装置)は、位相シフト法により3次元情報を測定する第1測定部(30)と、光切断法により3次元情報を測定する第2測定部(40)と、第1測定部および第2測定部の両方の測定結果に基づいて、測定対象の3次元情報を取得する制御装置(50)と、を備える。
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