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1. WO2020051748 - CALIBRATION METHOD AND CALIBRATION APPARATUS

Publication Number WO/2020/051748
Publication Date 19.03.2020
International Application No. PCT/CN2018/104894
International Filing Date 10.09.2018
IPC
B25J 13/00 2006.1
BPERFORMING OPERATIONS; TRANSPORTING
25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; HANDLES FOR HAND IMPLEMENTS; WORKSHOP EQUIPMENT; MANIPULATORS
JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
13Controls for manipulators
G01B 21/00 2006.1
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
CPC
B25J 13/00
BPERFORMING OPERATIONS; TRANSPORTING
25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
13Controls for manipulators
G01B 21/00
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
Applicants
  • 深圳配天智能技术研究院有限公司 SHENZHEN A & E INTELLIGENT TECHNOLOGY INSTITUTE CO., LTD. [CN]/[CN]
Inventors
  • 阳光 YANG, Guang
Agents
  • 深圳市威世博知识产权代理事务所(普通合伙) CHINA WISPRO INTELLECTUAL PROPERTY LLP.
Priority Data
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) CALIBRATION METHOD AND CALIBRATION APPARATUS
(FR) PROCÉDÉ D’ÉTALONNAGE ET APPAREIL D’ÉTALONNAGE
(ZH) 标定方法及标定装置
Abstract
(EN)
A calibration method, comprising: obtaining a first position parameter of a calibration apparatus in a first target coordinate system; obtaining a second position parameter of the calibration apparatus in a second target coordinate system; establishing a constraint relationship between the first position parameter and the second position parameter; completing calibration of a first target and a second target according to the constraint relationship. A calibration apparatus.
(FR)
L'invention concerne un procédé d'étalonnage consistant à : obtenir un premier paramètre de position d'un appareil d'étalonnage dans un premier système de coordonnées cible ; obtenir un second paramètre de position de l'appareil d'étalonnage dans un second système de coordonnées cible ; établir une relation de contrainte entre le premier paramètre de position et le second paramètre de position ; achever l'étalonnage d'une première cible et d'une seconde cible en fonction de la relation de contrainte. La présente invention concerne également un appareil d'étalonnage.
(ZH)
一种标定方法,包括:获取标定装置在第一目标坐标系下的第一位置参数;获取标定装置在第二目标坐标系下的第二位置参数;将第一位置参数和第二位置参数建立约束关系;根据约束关系完成第一目标和第二目标的标定。一种标定装置。
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