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1. WO2020004774 - APPARATUS AND METHOD FOR TESTING CIRCUIT BOARD INCLUDED IN BATTERY MANAGEMENT SYSTEM

Publication Number WO/2020/004774
Publication Date 02.01.2020
International Application No. PCT/KR2019/003262
International Filing Date 20.03.2019
IPC
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
02
Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
M
PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
10
Secondary cells; Manufacture thereof
42
Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
48
Accumulators combined with arrangements for measuring, testing, or indicating condition, e.g. level or density of the electrolyte
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
M
PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
10
Secondary cells; Manufacture thereof
42
Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
G01R 31/28 (2006.01)
G01R 31/02 (2006.01)
H01M 10/48 (2006.01)
H01M 10/42 (2006.01)
CPC
G01R 31/28
H01M 10/42
H01M 10/48
Applicants
  • 주식회사 엘지화학 LG CHEM, LTD. [KR/KR]; 서울시 영등포구 여의대로 128 128, Yeoui-daero, Yeongdeungpo-Gu, Seoul 07336, KR
Inventors
  • 이원재 LEE, Won-Jae; KR
Agents
  • 특허법인 필앤온지 PHIL & ONZI INT'L PATENT & LAW FIRM; 서울시 서초구 서초중앙로 36, 3층 3F., 36, Seochojungang-ro, Seocho-Gu, Seoul 06643, KR
Priority Data
10-2018-007576429.06.2018KR
Publication Language Korean (KO)
Filing Language Korean (KO)
Designated States
Title
(EN) APPARATUS AND METHOD FOR TESTING CIRCUIT BOARD INCLUDED IN BATTERY MANAGEMENT SYSTEM
(FR) APPAREIL ET PROCÉDÉ D'ESSAI D'UNE CARTE DE CIRCUIT IMPRIMÉ D'UN SYSTÈME DE GESTION DE BATTERIE
(KO) 배터리 관리 시스템에 포함된 회로 기판을 테스트하기 위한 장치 및 방법
Abstract
(EN)
Provided are an apparatus and method for testing a circuit board included in a battery management system. The circuit board comprises: a first test point commonly connected to one end of a first resistance element, one end of a first capacitor, and one end of a second resistance element; a second test point commonly connected to the other end of the second resistance element and one end of a second capacitor; a third test point connected to the other end of the first resistance element; and a fourth test point commonly connected to the other end of the first capacitor and the other end of the second capacitor. The apparatus determines an open failure of at least one of the first and second capacitors, on the basis of a first diagnostic voltage between the first and fourth test points and a second diagnostic voltage between the second and fourth test points.
(FR)
L'invention concerne un appareil et un procédé d'essai d'une carte de circuit imprimé d'un système de gestion de batterie. La carte de circuit imprimé comprend : un premier point d'essai connecté communément à une extrémité d'un premier élément de résistance, une extrémité d'un premier condensateur, et une extrémité d'un second élément de résistance ; un second point d'essai connecté communément à l'autre extrémité du second élément de résistance et une extrémité d'un second condensateur ; un troisième point d'essai connecté à l'autre extrémité du premier élément de résistance ; et un quatrième point d'essai connecté communément à l'autre extrémité du premier condensateur et à l'autre extrémité du second condensateur. L'appareil détermine une défaillance "circuit ouvert "d'au moins l'un des premier et second condensateurs, sur la base d'une première tension de diagnostic entre les premier et quatrième points d'essai et une seconde tension de diagnostic entre les deuxième et quatrième points d'essai.
(KO)
배터리 관리 시스템에 포함된 회로 기판을 테스트하기 위한 장치 및 방법이 제공된다. 상기 회로 기판은, 제1 저항 소자의 일단, 제1 커패시터의 일단 및 제2 저항 소자의 일단에 공통적으로 연결된 제1 테스트 포인트; 상기 제2 저항 소자의 타단 및 제2 커패시터의 일단에 공통적으로 연결된 제2 테스트 포인트; 상기 제1 저항 소자의 타단에 연결된 제3 테스트 포인트; 및 상기 제1 커패시터의 타단 및 상기 제2 커패시터의 타단에 공통적으로 연결된 제4 테스트 포인트를 포함한다. 상기 장치는, 상기 제1 및 제4 테스트 포인트 사이의 제1 진단 전압 및 상기 제2 및 제4 테스트 포인트 사이의 제2 진단 전압을 기초로, 상기 제1 커패시터 및 상기 제2 커패시터 중 적어도 하나의 오픈 불량을 판정한다.
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