Processing

Please wait...

Settings

Settings

1. WO2020001722 - A METHOD, A SYSTEM, AND A PROBE FOR DETERMINING IN-SITU AN OXIDATION-REDUCTION POTENTIAL IN A FORMATION HAVING A SURFACE

Note: Text based on automatic Optical Character Recognition processes. Please use the PDF version for legal matters

CLAIMS

1. Method (1000) of determining an oxidation-reduction potential (50) in a formation (10) having a surface (12), the method (1000) comprising acts of

- placing (1100) a reference electrode (52) at the surface (12);

- penetrating (1200) by direct push or rotary drilling or sonic drilling a probe (40) car rying an oxidation-reduction electrode (54) directly into the formation (10);

- determining (1400) the oxidation-reduction potential (50) as a potential difference between the reference electrode (52) and the oxidation-reduction electrode (54).

2. The method (1000) according to claim 1, wherein the act of determining (1400) the oxidation-reduction potential (50) is performed whilst penetrating (1200).

3. The method (1000) according to claim 1 or 2, wherein the act of penetrating (1200) is performed by directing the probe (40) as a function of time.

4. The method (1000) according to any one or more of claim 1 to 3, wherein the act of penetrating (1200) involves an act of establishing (1500) a penetration (62) of the probe (40) into the formation (10); and wherein the act of determining (1400) the oxi dation-reduction potential (54) is performed as a function of the penetration (62).

5. The method (1000) according to any one or more of claim 1 to 4, further compris ing an act of retracting (1300) the probe (40) from the formation (10) and performing a direct current (DC) resistivity measurement during retraction (1300).

6. A system (20) for determining in situ oxidation-reduction potential (50) in a for mation (10) having a surface (12) separating the formation (10) from the ambient at mosphere (16), the system (20) comprising:

- a controller (30) configured to communicate (32) with:

- a probe (40) for a penetration (62) into the formation (10) and comprising an oxidation-reduction electrode (54); and

- a reference electrode (52);

- the controller (30) configured to determine the oxidation-reduction potential (50) as a potential difference between the reference electrode (52) and the oxidation-reduction electrode (54).

7. The system (20) according to claim 6, and further comprising a penetrometer (60) in communication (32) with the controller (32), further configured to determine (1400) the oxidation-reduction potential (50) as a function of the penetration (62) into the formation (10).

8. The system (20) according to claim 6 or 7, further comprising a timer in communi cation (32) with the controller (30) that is further configured to determine (1400) the oxidation-reduction potential (50) as a function of time.

9. The system (20) according to any one or more of claims 6 to 8, wherein the probe (40) further comprising a meter (70), which meter is configured for measuring a direct current (DC) resistivity, and the controller (30) is further configured to determine (1400) resistivity (76) as a function of time, penetration (62), or both time and pene-tration (62).

10. The system (20) according to any one or more of claim 6 to 9, wherein the oxida tion-reduction electrode (54) is a metal electrode, substantially encapsulated in and galvanically isolated from a probe body (42) of the probe (40).

11. The system (20) according to claim 10, wherein the oxidation-reduction electrode (54) comprises an electrode body (55) encapsulating the metal electrode, wherein the electrode body (55) comprises a protrusion (58) complementary to a thoroughgoing recess (46) in the probe body (42), the protrusion (58) has an outer face (59) with an exposed part of the metal electrode.

12. The system (20) according to any one or more of claims 6 to 9, wherein the oxida tion-reduction electrode (54) being encapsulated by an electrode body (55), wherein the electrode body (55) comprises a protrusion (58) complementary to a thoroughgo-ing recess (46) in the probe body (42), the protrusion (58) has an outer face (59) with an exposed part of the oxidation-reduction electrode (54).

13. A computer program product comprising instructions on a computer to cause the svstem (201 accordine to anv one or more of claim 6 to 12 to nerform the method

(1000) of determining the oxidation-reduction potential (50), according to any one or more of claim 1 to 5.

14. A computer-readable medium having stored thereon the computer program of claim 13.

15. A probe (40) for a penetration (62) into a formation (10), the probe (40) compris-ing a probe body (42), having a probe front (44) for the penetration (62) of the for mation (10), the probe body (42) supporting an oxidation-reduction electrode (54)

16. The probe (40) according to claim 14, wherein the oxidation-reduction electrode (54) is a metal electrode, substantially encapsulated in and galvanically isolated from the probe body (42).

17. The probe (40) according to claim 15-16, wherein the oxidation-reduction elec trode being encapsulated by an electrode body (55), wherein the electrode body (55) comprises a protrusion (58) complementary to a thoroughgoing recess (46) in the probe body (42), the protrusion (58) has an outer face (59) with an exposed part of the oxidation-reduction electrode.