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1. WO2020001145 - FLAT PANEL DETECTOR AND MANUFACTURING METHOD THEREFOR

Publication Number WO/2020/001145
Publication Date 02.01.2020
International Application No. PCT/CN2019/084055
International Filing Date 24.04.2019
IPC
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14
including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144
Devices controlled by radiation
146
Imager structures
H01L 27/146 (2006.01)
CPC
H01L 27/146
Applicants
  • 京东方科技集团股份有限公司 BOE TECHNOLOGY GROUP CO., LTD. [CN/CN]; 中国北京市 朝阳区酒仙桥路10号 No.10 Jiuxianqiao Rd., Chaoyang District Beijing 100015, CN
  • 北京京东方光电科技有限公司 BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. [CN/CN]; 中国北京市 北京经济技术开发区西环中路8号 No.8 Xihuanzhonglu, BDA Beijing 100176, CN
Inventors
  • 张勇 ZHANG, Yong; CN
  • 华刚 HUA, Gang; CN
  • 薛艳娜 XUE, Yanna; CN
  • 林坚 LIN, Jian; CN
  • 包智颖 BAO, Zhiying; CN
  • 米磊 MI, Lei; CN
  • 白璐 BAI, Lu; CN
  • 方浩博 FANG, Haobo; CN
  • 王景棚 WANG, Jingpeng; CN
  • 张丽敏 ZHANG, Limin; CN
Agents
  • 中国专利代理(香港)有限公司 CHINA PATENT AGENT (H.K.) LTD.; 中国香港特别行政区 湾仔港湾道23号鹰君中心22号楼 22/F, Great Eagle Centre, 23 Harbour Road, Wanchai Hong Kong, CN
Priority Data
201810712771.129.06.2018CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) FLAT PANEL DETECTOR AND MANUFACTURING METHOD THEREFOR
(FR) DÉTECTEUR À PANNEAU PLAT ET SON PROCÉDÉ DE FABRICATION
(ZH) 平板探测器及其制备方法
Abstract
(EN)
Provided is a flat panel detector comprising a substrate and a plurality of photodiodes disposed on the substrate, and further comprising a first transparent conductive layer disposed at a side of the photodiodes away from the substrate. An orthographic projection of the first transparent conductive layer on the substrate at least partially overlaps with an orthographic projection of each photodiode on the substrate. The flat panel detector can alleviate or reduce effects of external static electricity and improve working stability.
(FR)
L'invention concerne un détecteur à panneau plat comprenant un substrat et une pluralité de photodiodes disposées sur le substrat, et comprenant en outre une première couche conductrice transparente disposée d'un côté des photodiodes à l'opposé du substrat. Une projection orthographique de la première couche conductrice transparente sur le substrat chevauche au moins partiellement une projection orthographique de chaque photodiode sur le substrat. Le détecteur à panneau plat peut atténuer ou réduire des effets d'électricité statique externe et améliorer la stabilité de travail.
(ZH)
提供了一种平板探测器,其包括衬底、设置在衬底上的多个光电二极管;还包括设置在光电二极管远离所述衬底一侧的第一透明导电层,第一透明导电层在衬底上的正投影与多个光电二极管的各个光电二极管在衬底上的正投影至少部分重叠。该平板探测器可以缓解或降低外部静电的影响,提升工作稳定性。
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