Processing

Please wait...

Settings

Settings

Goto Application

1. WO2019227220 - ELECTRONIC DEVICE TESTING SYSTEM, ELECTRONIC DEVICE PRODUCTION SYSTEM INCLUDING SAME AND METHOD OF TESTING AN ELECTRONIC DEVICE

Publication Number WO/2019/227220
Publication Date 05.12.2019
International Application No. PCT/CA2019/050743
International Filing Date 30.05.2019
IPC
G01N 22/00 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
22Investigating or analysing materials by the use of microwaves
H05K 13/08 2006.1
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
13Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
08Monitoring manufacture of assemblages
H05K 3/12 2006.1
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
3Apparatus or processes for manufacturing printed circuits
10in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
12using printing techniques to apply the conductive material
CPC
G01N 21/3581
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
3581using far infra-red light; using Terahertz radiation
G01N 22/02
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
22Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
02Investigating the presence of flaws
H05K 1/0268
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
1Printed circuits
02Details
0266Marks, test patterns or identification means
0268for electrical inspection or testing
H05K 1/0269
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
1Printed circuits
02Details
0266Marks, test patterns or identification means
0269for visual or optical inspection
H05K 1/097
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
1Printed circuits
02Details
09Use of materials for the ; conductive, e.g. ; metallic pattern
092Dispersed materials, e.g. conductive pastes or inks
097Inks comprising nanoparticles and specially adapted for being sintered at low temperature
H05K 13/082
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
13Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
08Monitoring manufacture of assemblages
082Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays
Applicants
  • SOCOVAR SEC [CA]/[CA]
Inventors
  • BLANCHARD, François
  • ZHULDYBINA, Mariia
Agents
  • NORTON ROSE FULBRIGHT CANADA LLP / S.E.N.C.R.L., S.R.L.
Priority Data
62/678,47931.05.2018US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) ELECTRONIC DEVICE TESTING SYSTEM, ELECTRONIC DEVICE PRODUCTION SYSTEM INCLUDING SAME AND METHOD OF TESTING AN ELECTRONIC DEVICE
(FR) SYSTÈME DE TEST DE DISPOSITIF ÉLECTRONIQUE, SYSTÈME DE PRODUCTION DE DISPOSITIF ÉLECTRONIQUE LE COMPRENANT ET PROCÉDÉ DE TEST D'UN DISPOSITIF ÉLECTRONIQUE
Abstract
(EN)
There is described an electronic device testing system for testing an electronic device having a substrate on which is printed a metamaterial structure using an ink. The electronic device testing system generally has: a terahertz radiation emitter configured to emit an incident terahertz radiation beam to be incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure; a terahertz radiation receiver configured to receive an outgoing terahertz radiation beam outgoing from the metamaterial structure and to measure an amplitude of an electric field of the outgoing terahertz radiation beam at least at the terahertz resonance frequency; and a controller configured to determine a conductivity value indicative of a conductivity of the ink based on said amplitude of the electric field of the outgoing terahertz radiation beam.
(FR)
L'invention concerne un système de test de dispositif électronique pour tester un dispositif électronique ayant un substrat sur lequel est imprimée une structure de métamatériau à l'aide d'une encre. Le système de test de dispositif électronique comprend généralement : un émetteur de rayonnement térahertz configuré pour émettre un faisceau de rayonnement térahertz incident devant être incident sur la structure de métamatériau du substrat, le faisceau de rayonnement térahertz incident ayant une puissance au moins au niveau de la fréquence de résonance térahertz de la structure de métamatériau ; un récepteur de rayonnement térahertz configuré pour recevoir un faisceau de rayonnement térahertz sortant sortant de la structure de métamatériau et pour mesurer une amplitude d'un champ électrique du faisceau de rayonnement térahertz sortant au moins à la fréquence de résonance térahertz ; et un dispositif de commande configuré pour déterminer une valeur de conductivité indiquant une conductivité de l'encre sur la base de ladite amplitude du champ électrique du faisceau de rayonnement térahertz sortant.
Related patent documents
Latest bibliographic data on file with the International Bureau