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1. WO2019157288 - SYSTEMS AND METHODS FOR PHYSICAL OBJECT ANALYSIS

Publication Number WO/2019/157288
Publication Date 15.08.2019
International Application No. PCT/US2019/017222
International Filing Date 08.02.2019
IPC
G01M 17/00 2006.1
GPHYSICS
01MEASURING; TESTING
MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
17Testing of vehicles
G01N 21/88 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws, defects or contamination
G06Q 40/08 2012.1
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
QDATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR
40Finance; Insurance; Tax strategies; Processing of corporate or income taxes
08Insurance, e.g. risk analysis or pensions
G07C 5/00 2006.1
GPHYSICS
07CHECKING-DEVICES
CTIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
5Registering or indicating the working of vehicles
CPC
G01M 17/007
GPHYSICS
01MEASURING; TESTING
MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
17Testing of vehicles
007Wheeled or endless-tracked vehicles
G01N 2021/8883
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
8883involving the calculation of gauges, generating models
G01N 21/8851
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
G06K 9/6284
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
9Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
62Methods or arrangements for recognition using electronic means
6267Classification techniques
6279relating to the number of classes
6284Single class perspective, e.g. one-against-all classification; Novelty detection; Outlier detection
G06N 5/025
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
5Computer systems using knowledge-based models
02Knowledge representation
025Extracting rules from data
G06Q 10/20
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
QDATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR
10Administration; Management
20Product repair or maintenance administration
Applicants
  • NANO TECHGALAXY, INC. D/B/A GALAXY.AI [US]/[US]
Inventors
  • LINDEMAN, Jacob, Cline
  • LOUIZOS, Louizos, Alexandros
Agents
  • RABINOVITCH, Ido
Priority Data
62/628,40009.02.2018US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) SYSTEMS AND METHODS FOR PHYSICAL OBJECT ANALYSIS
(FR) SYSTÈMES ET PROCÉDÉS POUR ANALYSE D'OBJET PHYSIQUE
Abstract
(EN) Disclosed are devices, systems, apparatus, methods, products, and other implementations, including a method that includes obtaining physical object data for a physical object, determining a physical object type based on the obtained physical object data, and determining based on the obtained physical object data, using at least one processor-implemented learning engine, findings data comprising structural deviation data representative of deviation between the obtained physical object data and normal physical object data representative of normal structural conditions for the determined physical object type.
(FR) L'invention concerne des dispositifs, des systèmes, des appareils, des procédés, des produits et d'autres mises en oeuvre, dont un procédé qui consiste à obtenir des données d'objet physique pour un objet physique, déterminer un type d'objet physique sur la base des données d'objet physique obtenues, et déterminer sur la base des données d'objet physique obtenues, à l'aide d'au moins un moteur d'apprentissage mis en oeuvre par processeur, des données de résultats comprenant des données d'écart structurel représentatives d'un écart entre les données d'objet physique obtenues et des données d'objet physique normales représentatives de conditions structurelles normales pour le type d'objet physique déterminé.
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