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1. WO2019130668 - AUTOMATED ANALYZER AND AUTOMATED ANALYSIS METHOD

Publication Number WO/2019/130668
Publication Date 04.07.2019
International Application No. PCT/JP2018/032999
International Filing Date 06.09.2018
IPC
G01N 35/00 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
G01N 35/02 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
CPC
G01N 2035/009
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
00584Control arrangements for automatic analysers
00722Communications; Identification
00891Displaying information to the operator
009alarms, e.g. audible
G01N 21/274
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27using photo-electric detection
274Calibration, base line adjustment, drift correction
G01N 21/47
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
47Scattering, i.e. diffuse reflection
G01N 27/4163
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
26by investigating electrochemical variables; by using electrolysis or electrophoresis
416Systems
4163checking the operation of, or calibrating, the measuring apparatus
G01N 27/4175
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
26by investigating electrochemical variables; by using electrolysis or electrophoresis
416Systems
417using cells ; , i.e. more than one cell; and probes with solid electrolytes
4175Calibrating or checking the analyser
G01N 35/00603
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
00584Control arrangements for automatic analysers
00594Quality control, including calibration or testing of components of the analyser
00603Reinspection of samples
Applicants
  • 株式会社日立ハイテク HITACHI HIGH-TECH CORPORATION [JP]/[JP]
Inventors
  • 風間 佑斗 KAZAMA, Yuto
  • 飯島 昌彦 IIJIMA, Masahiko
  • 藪谷 千枝 YABUTANI, Chie
  • 小暮 研二 KOGURE, Kenji
Agents
  • 特許業務法人筒井国際特許事務所 TSUTSUI & ASSOCIATES
Priority Data
2017-24951326.12.2017JP
Publication Language Japanese (ja)
Filing Language Japanese (JA)
Designated States
Title
(EN) AUTOMATED ANALYZER AND AUTOMATED ANALYSIS METHOD
(FR) ANALYSEUR AUTOMATIQUE ET PROCÉDÉ D'ANALYSE AUTOMATIQUE
(JA) 自動分析装置および自動分析方法
Abstract
(EN) The present invention makes it possible for an automated analyzer comprising two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer comprises, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers (step S204(C)), the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results (step S205).
(FR) La présente invention permet à un analyseur automatisé, comprenant au moins deux types de photomètres, d'obtenir une sortie appropriée des résultats de mesure de la pluralité de photomètres et une sortie appropriée d'alarme de données, même s'il y se produit une anomalie, ou un événement similaire, au moment de la mesure. Cet analyseur automatisé comprend, par exemple, deux types de photomètres ayant différentes plages quantitatives et une unité de commande d'analyse permettant de commander l'analyse, qui comprend la mesure d'un échantillon donné à l'aide des deux types de photomètres. Si deux types d'alarmes de données correspondant à des anomalies, ou à des événements analogues, ont été ajoutés pendant la mesure aux deux types de résultats de mesure à partir des deux types de photomètres (étape S204 (C)), l'unité de commande d'analyse sélectionne un résultat de mesure et une sortie d'alarme de données correspondant à la combinaison des deux types d'alarmes de données et les fournit à un utilisateur sous forme de résultats d'analyse (étape S205).
(JA) 2種類以上の複数の光度計を備える自動分析装置に関して、測定時の異常等があった場合でも、複数の光度計の測定結果およびデータアラームからの好適な出力を実現できる技術を提供する。自動分析装置は、定量範囲が異なる例えば2種類の光度計と、対象の検体について2種類の光度計を用いた測定を含む分析を制御する分析制御部とを備える。分析制御部は、2種類の光度計を用いた2種類の測定結果に、測定時の異常等に応じた、2種類のデータアラームが付記されている場合(ステップS204-(C))には、2種類のデータアラームの組み合わせに対応させて、出力する測定結果およびデータアラームを選択して分析結果としてユーザに対して出力する(ステップS205)。
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