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1. (WO2019067724) THICK ALKALI METAL HALIDE PEROVSKITE FILMS FOR LOW DOSE FLAT PANEL X-RAY IMAGERS
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Pub. No.: WO/2019/067724 International Application No.: PCT/US2018/053131
Publication Date: 04.04.2019 International Filing Date: 27.09.2018
IPC:
G01T 1/00 (2006.01) ,G01T 1/16 (2006.01) ,G01T 1/24 (2006.01)
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
24
with semiconductor detectors
Applicants:
NORTHWESTERN UNIVERSITY [US/US]; 633 Clark Street Evanston, Illinois 60208, US
Inventors:
KANATZIDIS, Mercouri G.; US
XU, Yadong; US
Agent:
MANNING, Michelle; US
BELL, Callie M.; US
POREMBSKI, N. Meredith; US
KALAFUT, Christopher L.; US
Priority Data:
62/565,35829.09.2017US
Title (EN) THICK ALKALI METAL HALIDE PEROVSKITE FILMS FOR LOW DOSE FLAT PANEL X-RAY IMAGERS
(FR) FILMS DE PÉROVSKITE À HALOGÉNURE DE MÉTAL ALCALIN ÉPAIS POUR IMAGEURS À RAYONS X À ÉCRAN PLAT À FAIBLE DOSE
Abstract:
(EN) Methods and devices that use alkali metal chalcohalides having the chemical formula A2TeX6, wherein A is Cs or Rb and X is I or Br, to convert hard radiation, such as X-rays, gamma-rays, and/or alpha-particles, into an electric signal are provided. The devices include optoelectronic and photonic devices, such as photodetectors and photodiodes. The method includes exposing the alkali metal chalcohalide material to incident radiation, wherein the material absorbs the incident radiation and electron-hole pairs are generated in the material. A detector is configured to measure a signal generated by the electron-hole pairs that are formed when the material is exposed to incident radiation.
(FR) L'invention concerne des procédés et des dispositifs utilisant des chalcohalides de métal alcalin possédant la formule chimique A2TeX6, A correspondant à du Cs ou du Rb et X correspondant à du I ou du Br, afin de convertir un rayonnement dur, tel que des rayons X, des rayons gamma et/ou des particules alpha, en un signal électrique. Les dispositifs comprennent des dispositifs optoélectroniques et photoniques, tels que des photodétecteurs et des photodiodes. Le procédé comprend l'exposition du matériau de chalcohalides de métal alcalin à un rayonnement incident, le matériau absorbant le rayonnement incident et des paires électron-trou étant générées dans le matériau. Un détecteur est conçu pour mesurer un signal généré par les paires électron-trou formées lorsque le matériau est exposé au rayonnement incident.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)