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1. (WO2019067641) SYSTEMS AND METHODS FOR VISUAL INSPECTION BASED ON AUGMENTED REALITY
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Pub. No.: WO/2019/067641 International Application No.: PCT/US2018/052988
Publication Date: 04.04.2019 International Filing Date: 26.09.2018
IPC:
G06F 3/01 (2006.01) ,G06F 17/30 (2006.01) ,G06F 17/50 (2006.01) ,H04N 13/117 (2018.01) ,G01N 21/95 (2006.01) ,G01N 23/02 (2006.01) ,G01N 27/90 (2006.01)
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
3
Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
01
Input arrangements or combined input and output arrangements for interaction between user and computer
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
17
Digital computing or data processing equipment or methods, specially adapted for specific functions
30
Information retrieval; Database structures therefor
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
17
Digital computing or data processing equipment or methods, specially adapted for specific functions
50
Computer-aided design
[IPC code unknown for H04N 13/117]
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
95
characterised by the material or shape of the object to be examined
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
72
by investigating magnetic variables
82
for investigating the presence of flaws
90
using eddy currents
Applicants:
AQUIFI, INC. [US/US]; 2225 E. Bayshore Rd., Ste. 110 Palo Alto, CA 94303, US
Inventors:
DAL MUTTO, Carlo; US
TRACHEWSKY, Jason; US
ZUCCARINO, Tony; US
Agent:
LEE, Shaun, P.; US
Priority Data:
62/563,56026.09.2017US
Title (EN) SYSTEMS AND METHODS FOR VISUAL INSPECTION BASED ON AUGMENTED REALITY
(FR) SYSTÈMES ET PROCÉDÉS D'INSPECTION VISUELLE FONDÉS SUR LA RÉALITÉ AUGMENTÉE
Abstract:
(EN) A system for visual inspection includes: a scanning system configured to capture images of an object and to compute a three-dimensional (3-D) model of the object based on the captured images; an inspection system configured to: compute a descriptor of the object based on the 3-D model of the object; retrieve metadata corresponding to the object based on the descriptor; and compute a plurality of inspection results based on the retrieved metadata and the 3-D model of the object; and a display device system including: a display; a processor; and a memory storing instructions that, when executed by the processor, cause the processor to: generate overlay data from the inspection results; and show the overlay data on the display, the overlay data being aligned with a view of the object through the display.
(FR) La présente invention concerne un système d'inspection visuelle comprenant : un système de balayage configuré pour capturer des images d'un objet et pour calculer un modèle tridimensionnel (3-D) de l'objet sur la base des images capturées; un système d'inspection configuré : pour calculer un descripteur de l'objet sur la base du modèle 3D de l'objet; pour récupérer des métadonnées correspondant à l'objet sur la base du descripteur; et pour calculer une pluralité de résultats d'inspection sur la base des métadonnées extraites et du modèle 3D de l'objet; et un système de dispositif d'affichage comprenant : un dispositif d'affichage; un processeur; et une mémoire stockant des instructions qui, lorsqu'elles sont exécutées par le processeur, amènent le processeur : à générer des données de superposition à partir des résultats d'inspection; et à afficher les données de superposition sur le dispositif d'affichage, les données de superposition étant alignées avec une vue de l'objet sur le dispositif d'affichage.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)