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1. (WO2019066551) CONTACTOR FAILURE RATE PREDICTION SYSTEM AND METHOD
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Pub. No.: WO/2019/066551 International Application No.: PCT/KR2018/011524
Publication Date: 04.04.2019 International Filing Date: 28.09.2018
IPC:
G01R 31/00 (2006.01) ,G01R 31/04 (2006.01) ,G01R 19/145 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
02
Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
04
Testing connections, e.g. of plugs, of non-disconnectable joints
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
19
Arrangements for measuring currents or voltages or for indicating presence or sign thereof
145
Indicating the presence of current or voltage
Applicants:
주식회사 엘지화학 LG CHEM, LTD. [KR/KR]; 서울시 영등포구 여의대로 128 128, Yeoui-daero, Yeongdeungpo-gu, Seoul 07336, KR
Inventors:
조현기 CHO, Hyunki; KR
성창현 SUNG, Chang Hyun; KR
이상훈 LEE, Sang Hoon; KR
최연식 CHOI, Yean Sik; KR
Agent:
정순성 CHUNG, Soon-Sung; KR
Priority Data:
10-2017-012721529.09.2017KR
Title (EN) CONTACTOR FAILURE RATE PREDICTION SYSTEM AND METHOD
(FR) SYSTÈME ET PROCÉDÉ DE PRÉDICTION DE TAUX DE DÉFAILLANCE DE CONTACTEUR
(KO) 컨텍터의 고장률 예측 시스템 및 방법
Abstract:
(EN) The present invention relates to a contactor failure rate prediction system and method, which calculate a lifespan index of the contactor on the basis of whether primary-side and secondary-side through-currents are normal and determine that a failure rate of the contactor increases when a count value for an abnormal through-current exceeds a preset threshold, thereby enabling a failure rate or a lifespan to be predicted and diagnosed in advance before a failure of the contactor occurs.
(FR) La présente invention concerne un système et un procédé de prédiction de taux de défaillance de contacteur, qui calculent un indice de durée de vie du contacteur selon que des courants traversants côté primaire et côté secondaire sont normaux ou non et qui déterminent qu'un taux de défaillance du contacteur augmente lorsqu'une valeur de comptage d'un courant traversant anormal dépasse un seuil prédéfini, ce qui permet de prédire et de diagnostiquer à l'avance un taux de défaillance ou une durée de vie avant qu'une défaillance du contacteur ne se produise.
(KO) 본 발명은 컨텍터의 1차측 및 2차측의 통전 전류의 정상여부를 토대로 컨텍터의 수명 지수를 카운트 하며, 비정상적인 통전 전류에 대한 카운트값이 기 설정된 임계값을 초과하는 경우 컨텍터의 고장률이 증가되는 것으로 판단함으로써, 컨텍터의 고장 발생 이전에 미리 고장률 혹은 수명을 예측 진단할 수 있는 컨텍터의 고장률 예측 시스템 및 방법에 관한 것이다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)