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1. (WO2019065744) STRAIN GAUGE
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Pub. No.: WO/2019/065744 International Application No.: PCT/JP2018/035713
Publication Date: 04.04.2019 International Filing Date: 26.09.2018
IPC:
G01B 7/16 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7
Measuring arrangements characterised by the use of electric or magnetic means
16
for measuring the deformation in a solid, e.g. by resistance strain gauge
Applicants:
ミネベアミツミ株式会社 MINEBEA MITSUMI INC. [JP/JP]; 長野県北佐久郡御代田町大字御代田4106-73 4106-73 Oaza Miyota, Miyota-machi, Kitasaku-gun, Nagano 3890293, JP
Inventors:
浅川 寿昭 ASAKAWA, Toshiaki; JP
丹羽 真一 NIWA, Shinichi; JP
相澤 祐汰 AIZAWA, Yuta; JP
北村 厚 KITAMURA, Atsushi; JP
Agent:
伊東 忠重 ITOH, Tadashige; JP
伊東 忠彦 ITOH, Tadahiko; JP
Priority Data:
2017-19182129.09.2017JP
Title (EN) STRAIN GAUGE
(FR) JAUGE EXTENSOMÉTRIQUE
(JA) ひずみゲージ
Abstract:
(EN) This strain gauge has a flexible substrate and a resistor formed from a material containing chromium and/or nickel on the substrate, wherein the coefficient of expansion of the substrate is in the range of 7-20 ppm/K.
(FR) La jauge extensométrique selon l’invention possède: un substrat flexible; et une résistance formée sur le substrat à partir d’un matériau contenant du chrome et/ou du nickel. Le coefficient de dilatation du substrat est compris dans la plage: 7 ppm/K~20 ppm/K.
(JA) 本ひずみゲージは、可撓性を有する基材と、前記基材上に、クロムとニッケルの少なくとも一方を含む材料から形成された抵抗体と、を有し、前記基材の膨張係数が7ppm/K~20ppm/Kの範囲内である。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)