Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2019065740) STRAIN GAUGE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2019/065740 International Application No.: PCT/JP2018/035706
Publication Date: 04.04.2019 International Filing Date: 26.09.2018
IPC:
G01B 7/16 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7
Measuring arrangements characterised by the use of electric or magnetic means
16
for measuring the deformation in a solid, e.g. by resistance strain gauge
Applicants:
ミネベアミツミ株式会社 MINEBEA MITSUMI INC. [JP/JP]; 長野県北佐久郡御代田町大字御代田4106-73 4106-73 Oaza Miyota, Miyota-machi, Kitasaku-gun, Nagano 3890293, JP
Inventors:
浅川 寿昭 ASAKAWA, Toshiaki; JP
相澤 祐汰 AIZAWA, Yuta; JP
戸田 慎也 TODA, Shinya; JP
▲高▼田 真太郎 TAKATA, Shintaro; JP
丹羽 真一 NIWA, Shinichi; JP
Agent:
伊東 忠重 ITOH, Tadashige; JP
伊東 忠彦 ITOH, Tadahiko; JP
Priority Data:
2017-19182029.09.2017JP
Title (EN) STRAIN GAUGE
(FR) JAUGE EXTENSOMÉTRIQUE
(JA) ひずみゲージ
Abstract:
(EN) This strain gauge has a flexible substrate, a functional layer formed from a metal, an alloy, or a metal compound on one surface of the substrate, and a resistor formed from a material containing chromium and/or nickel on one surface of the functional layer.
(FR) La jauge extensométrique selon l’invention possède: un substrat flexible; une couche fonctionnelle formée sur une face du substrat à partir d’un métal, d’un alliage métallique ou d'un composé métallique; et une résistance formée sur une face de la couche fonctionnelle à partir d'un matériau contenant du chrome et/ou du nickel.
(JA) 本ひずみゲージは、可撓性を有する基材と、前記基材の一方の面に、金属、合金、又は、金属の化合物から形成された機能層と、前記機能層の一方の面に、クロムとニッケルの少なくとも一方を含む材料から形成された抵抗体と、を有する。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)