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1. (WO2019065057) ANALYSIS DEVICE
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Pub. No.: WO/2019/065057 International Application No.: PCT/JP2018/031943
Publication Date: 04.04.2019 International Filing Date: 29.08.2018
IPC:
G01N 21/64 (2006.01) ,G01N 21/05 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
03
Cuvette constructions
05
Flow-through cuvettes
Applicants:
株式会社日立ハイテクノロジーズ HITACHI HIGH-TECHNOLOGIES CORPORATION [JP/JP]; 東京都港区西新橋一丁目24番14号 24-14, Nishi-Shimbashi 1-chome, Minato-ku, Tokyo 1058717, JP
Inventors:
穴沢 隆 ANAZAWA Takashi; JP
山崎 基博 YAMAZAKI Motohiro; JP
中澤 太朗 NAKAZAWA Taro; JP
藤岡 満 FUJIOKA Michiru; JP
Agent:
特許業務法人磯野国際特許商標事務所 ISONO INTERNATIONAL PATENT OFFICE, P.C.; 東京都港区虎ノ門一丁目1番18号 ヒューリック虎ノ門ビル Hulic Toranomon Building, 1-18, Toranomon 1-chome, Minato-ku, Tokyo 1050001, JP
Priority Data:
2017-19170529.09.2017JP
Title (EN) ANALYSIS DEVICE
(FR) DISPOSITIF D'ANALYSE
(JA) 分析装置
Abstract:
(EN) In order to avoid crosstalk between formed images using a simple method, the present invention is characterized by having an optical system (P) through which light emitted from a plurality of light-emitting points passes, and a measuring unit for measuring light which has been formed into images by the optical system (P), wherein among the light-emitting points, the middle point between any two light-emitting points is offset from a center (CA) of the optical system (P). More specifically, this analysis device is characterized in that the center (CA) of the optical system (P) exists outside of light-emitting point groups which are aggregates of a plurality of light-emitting points E. With this configuration, a main image (M) and a ghost image (G) are separated from each other, and thus it is possible to avoid crosstalk caused by ghosting and to correctly analyze light emissions from the plurality of light-emitting points (E).
(FR) Afin d'éviter une diaphonie entre des images formées à l'aide d'un procédé simple, la présente invention comprend un système optique (P) à travers lequel passe la lumière émise par une pluralité de points d'émission de lumière, et une unité de mesure permettant de mesurer la lumière ayant été formée en images par le système optique (P). Parmi les points d'émission de lumière, le point médian entre deux points d'émission de lumière quelconques est décalé par rapport à un centre (CA) du système optique (P). Plus particulièrement, ledit dispositif d'analyse est caractérisé en ce que le centre (CA) du système optique (P) est situé à l'extérieur de groupes de points d'émission de lumière constituant des agrégats d'une pluralité de points d'émission de lumière E. Grâce à cette configuration, une image principale (M) et une image fantôme (G) sont séparées l'une de l'autre, ce qui permet d'éviter une diaphonie provoquée par un fantôme et d'analyser correctement les émissions de lumière provenant de la pluralité de points d'émission de lumière (E).
(JA) 簡易な手法で結像画像間のクロストークを回避するため、複数の発光点から発せられた光が通過する光学系(P)と、光学系(P)によって結像された光を計測する計測部と、を有し、発光点のうち、任意の2つの発光点の中点が、光学系(P)の中心(CA)からずれていることを特徴とする。より具体的には、複数の発光点Eの集合体である発光点群の外側に光学系(P)の中心(CA)が存在することを特徴とする。以上の構成により、メイン像(M)と、ゴースト像(G)が分離されるため、ゴーストによるクロストークを回避することができ、複数の発光点(E)からの発光を正しく分析することができる。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)