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1. (WO2019064787) SCINTILLATOR PANEL AND RADIATION DETECTOR
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Pub. No.: WO/2019/064787 International Application No.: PCT/JP2018/025238
Publication Date: 04.04.2019 International Filing Date: 03.07.2018
IPC:
G21K 4/00 (2006.01) ,G01T 1/20 (2006.01) ,G01T 1/202 (2006.01)
G PHYSICS
21
NUCLEAR PHYSICS; NUCLEAR ENGINEERING
K
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
4
Conversion screens for the conversion of the spatial distribution of particles or ionising radiation into visible images, e.g. fluoroscopic screens
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
20
with scintillation detectors
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
20
with scintillation detectors
202
the detector being a crystal
Applicants:
浜松ホトニクス株式会社 HAMAMATSU PHOTONICS K.K. [JP/JP]; 静岡県浜松市東区市野町1126番地の1 1126-1, Ichino-cho, Higashi-ku, Hamamatsu-shi, Shizuoka 4358558, JP
Inventors:
山路 晴紀 YAMAJI Haruki; JP
白川 和広 SHIRAKAWA Kazuhiro; JP
後藤 啓輔 GOTO Keisuke; JP
上西 秀典 JONISHI Hidenori; JP
畑中 将志 HATANAKA Masashi; JP
櫻井 純 SAKURAI Jun; JP
Agent:
長谷川 芳樹 HASEGAWA Yoshiki; JP
黒木 義樹 KUROKI Yoshiki; JP
柴山 健一 SHIBAYAMA Kenichi; JP
Priority Data:
2017-18655727.09.2017JP
Title (EN) SCINTILLATOR PANEL AND RADIATION DETECTOR
(FR) PANNEAU SCINTILLATEUR ET DÉTECTEUR DE RAYONNEMENT
(JA) シンチレータパネル及び放射線検出器
Abstract:
(EN) This scintillator panel (10) comprises a substrate (11) having a substrate main surface (11a), substrate rear surface (11b), and substrate side surface (11c) and a scintillator layer (12) that is formed from a plurality of columnar crystals and has a scintillator rear surface (12b), scintillator main surface (12a), and scintillator side surface (12c). The substrate side surface (11c) and scintillator side surface (12c) are roughly flush with each other. The angle (A1) between the substrate rear surface (11b) and substrate side surface (11c) of the substrate (11) is less than 90 degrees.
(FR) Selon la présente invention, ce panneau de scintillateur (10) comprend un substrat (11) ayant une surface principale de substrat (11a), une surface arrière de substrat (11b) et une surface latérale de substrat (11c) et une couche de scintillateur (12) qui est formée à partir d'une pluralité de cristaux colonnaires et a une surface arrière de scintillateur (12b), une surface principale de scintillateur (12a) et une surface latérale de scintillateur (12c). La surface latérale de substrat (11c) et la surface latérale de scintillateur (12c) sont à peu près alignées l'une avec l'autre. L'angle (A1) entre la surface arrière de substrat (11b) et la surface latérale de substrat (11c) du substrat (11) est inférieur à 90 degrés.
(JA) シンチレータパネル(10)は、基板主面(11a)、基板裏面(11b)及び基板側面(11c)を有する基板(11)と、複数の柱状結晶により形成され、シンチレータ裏面(12b)、シンチレータ主面(12a)及びシンチレータ側面(12c)を有するシンチレータ層(12)と、を備える。基板側面(11c)及びシンチレータ側面(12c)は、互いに略面一である。基板(11)において、基板裏面(11b)と基板側面(11c)との間の角度(A1)は、90度未満である。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)