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1. (WO2019064530) ELECTRON BEAM APPARATUS, DEVICE MANUFACTURING METHOD, EXPOSURE METHOD, AND PHOTOELECTRIC ELEMENT
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Pub. No.: WO/2019/064530 International Application No.: PCT/JP2017/035598
Publication Date: 04.04.2019 International Filing Date: 29.09.2017
IPC:
H01L 21/027 (2006.01) ,G03F 7/20 (2006.01) ,H01J 37/073 (2006.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
21
Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
02
Manufacture or treatment of semiconductor devices or of parts thereof
027
Making masks on semiconductor bodies for further photolithographic processing, not provided for in group H01L21/18 or H01L21/34165
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
F
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
7
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
20
Exposure; Apparatus therefor
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
02
Details
04
Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
06
Electron sources; Electron guns
073
Electron guns using field emission, photo emission, or secondary emission electron sources
Applicants:
株式会社ニコン NIKON CORPORATION [JP/JP]; 東京都港区港南二丁目15番3号 15-3, Konan 2-chome, Minato-ku, Tokyo 1086290, JP
Inventors:
佐藤 真路 SATO, Shinji; JP
Agent:
立石 篤司 TATEISHI, Atsuji; JP
Priority Data:
Title (EN) ELECTRON BEAM APPARATUS, DEVICE MANUFACTURING METHOD, EXPOSURE METHOD, AND PHOTOELECTRIC ELEMENT
(FR) APPAREIL À FAISCEAU ÉLECTRONIQUE, PROCÉDÉ DE FABRICATION DE DISPOSITIF, PROCÉDÉ D'EXPOSITION ET ÉLÉMENT PHOTOÉLECTRIQUE
(JA) 電子ビーム装置、デバイス製造方法、露光方法及び光電素子
Abstract:
(EN) An electron beam apparatus comprises: a plurality of light emitting units (84a); and an electron beam optical system that makes electrons into a plurality of electron beams (EB) and can bombard a target therewith, said electrons being emitted from a photoelectric conversion layer (60) by the photoelectric conversion layer (60) being irradiated with a plurality of light beams (LB) due to the light emission of the plurality of light emitting units, wherein the lights from each of the plurality of light emitting units are incident on the photoelectric conversion layer (60) without passing through a space.
(FR) Cette invention concerne un appareil à faisceau électronique, comprenant : une pluralité d'unités d'émission de lumière (84a) ; et un système optique à faisceau électronique qui forme des électrons en une pluralité de faisceaux électroniques (EB) et peut bombarder une cible avec ceux-ci, lesdits électrons étant émis à partir d'une couche de conversion photoélectrique (60) sous l'effet de l'irradiation de couche de conversion photoélectrique (60) par une pluralité de faisceaux lumineux (LB) provenant de l'émission de lumière de la pluralité d'unités d'émission de lumière, la lumière provenant de chacune de la pluralité d'unités d'émission de lumière étant incidente sur la couche de conversion photoélectrique (60) sans passer à travers un espace.
(JA) 電子ビーム装置は、複数の発光部(84a)と、複数の発光部の発光により複数の光ビーム(LB)が光電変換層(60)に照射されることによって光電変換層(60)から放出される電子を複数の電子ビーム(EB)としてターゲットに照射可能な電子ビーム光学系と、を備え、複数の発光部それぞれからの光は、空間を介さずに光電変換層(60)に入射する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)