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1. (WO2019064472) UV LIGHT IRRADIATION DEVICE AND UV LIGHT IRRADIATION METHOD
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/064472 International Application No.: PCT/JP2017/035416
Publication Date: 04.04.2019 International Filing Date: 29.09.2017
IPC:
G03F 7/20 (2006.01)
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
F
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
7
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
20
Exposure; Apparatus therefor
Applicants:
シャープ株式会社 SHARP KABUSHIKI KAISHA [JP/JP]; 大阪府堺市堺区匠町1番地 1, Takumi-cho, Sakai-ku, Sakai City, Osaka 5908522, JP
Inventors:
昼岡 正樹 HIRUOKA, Masaki; --
Agent:
特許業務法人HARAKENZO WORLD PATENT & TRADEMARK HARAKENZO WORLD PATENT & TRADEMARK; 大阪府大阪市北区天神橋2丁目北2番6号 大和南森町ビル Daiwa Minamimorimachi Building, 2-6, Tenjinbashi 2-chome Kita, Kita-ku, Osaka-shi, Osaka 5300041, JP
Priority Data:
Title (EN) UV LIGHT IRRADIATION DEVICE AND UV LIGHT IRRADIATION METHOD
(FR) DISPOSITIF DE RAYONNEMENT DE LUMIÈRE UV ET PROCÉDÉ DE RAYONNEMENT DE LUMIÈRE UV
(JA) UV光照射装置及びUV光照射方法
Abstract:
(EN) Disclosed is an UV light irradiation device (1) wherein: a supporting pin (20) supports a subject (50) to be irradiated with UV light (A) at the time of irradiating the subject (50) with the UV light; and a difference between the UV light (A) reflectance of a leading end section (22) of the supporting pin (20) and that of a surface (12) of a stage (10) is equal to 1 % or lower.
(FR) L'invention concerne un dispositif de rayonnement de lumière UV (1) dans lequel : une broche de support (20) supporte un sujet (50) à irradier avec une lumière UV (A) au moment de l'irradiation du sujet (50) avec la lumière UV; et une différence entre la réflectance de la lumière UV (A) d'une section d'extrémité avant (22) de la broche de support (20) et celle d'une surface (12) d'un étage (10) est égale à 1 % ou moins.
(JA) 支持ピン(20)は、被照射体(50)にUV光(A)を照射する際、被照射体(50)を支持し、支持ピン(20)の先端部(22)とステージ(10)の表面(12)との、UV光(A)の反射率の差が1%以下であるUV光照射装置(1)。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)