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1. (WO2019062207) IMPEDANCE TEST PROBE AND PCB IMPEDANCE TEST MACHINE
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Pub. No.: WO/2019/062207 International Application No.: PCT/CN2018/090921
Publication Date: 04.04.2019 International Filing Date: 13.06.2018
IPC:
G01R 27/02 (2006.01) ,G01R 1/073 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
073
Multiple probes
Applicants:
南京协辰电子科技有限公司 JOINT STARS TECHNOLOGY CO, LTD [CN/CN]; 中国江苏省南京市 江宁经济技术开发区吉印大道3128号3幢 Building 3, No.3128, Jiyin Road, Jiangning District Nanjing, Jiangsu 211106, CN
Inventors:
宋卫华 SONG, Weihua; CN
叶宗顺 YE, Zongshun; CN
Agent:
南京瑞弘专利商标事务所(普通合伙) NANJING RUIHONG PATENT & TRADEMARK AGENCY (ORDINARY PARTNERSHIP); 中国江苏省南京市 玄武区龙蟠路155号3幢411室 Room 411, Building 3, No.155 Long Pan Road, Xuanwu District Nanjing, Jiangsu 210000, CN
Priority Data:
201710922715.630.09.2017CN
Title (EN) IMPEDANCE TEST PROBE AND PCB IMPEDANCE TEST MACHINE
(FR) SONDE DE TEST D'IMPÉDANCE ET MACHINE DE TEST D'IMPÉDANCE DE CARTE DE CIRCUIT IMPRIMÉ
(ZH) 一种阻抗测试探头及一种PCB阻抗测试机
Abstract:
(EN) An impedance test probe, comprising: at least two probe pins (1, 2) and a probe pin short-circuiting device (3). The probe pin short-circuiting device (3) is an elastic short-circuiting device. One end of the probe pin short-circuiting device (3) is fixedly connected to the tip of one of the probe pins (1, 2), and the other end may contact and be connected to the tip of any one of the remaining probe pins (1, 2). The short-circuiting connection between the probe pins (1, 2) is a flexible connection, and can make the spacing and angle between the tips of the probe pins (1, 2) for high-frequency impedance tests adjustable, so that the costs of a probe pin group are reduced and the working efficiency and test precision are improved. In addition, automatic production of the impedance tests is made possible.
(FR) L'invention concerne une sonde de test d'impédance, comprenant : au moins deux broches de sonde (1, 2) et un dispositif de court-circuit de broche de sonde (3). Le dispositif de court-circuit de broche de sonde (3) est un dispositif de court-circuit élastique. Une extrémité du dispositif de court-circuit de broche de sonde (3) est reliée de manière fixe à la pointe de l'une des broches de sonde (1, 2), et l'autre extrémité peut entrer en contact avec la pointe de l'une quelconque des broches de sonde restantes (1, 2) et être reliée à celle-ci. La connexion de court-circuit entre les broches de sonde (1, 2) est une connexion flexible et elle permet de régler l'espacement et l'angle entre les pointes des broches de sonde (1, 2) pour des tests d'impédance à haute fréquence, de sorte que les coûts d'un groupe de broches de sonde sont réduits et l'efficacité de travail et la précision de test sont améliorées. De plus, la production automatique de tests d'impédance est rendue possible.
(ZH) 一种阻抗测试探头,其包括:探针(1,2),探针(1,2)至少有两根;以及探针短接装置(3);探针短接装置(3)为弹性短接装置,探针短接装置(3)的一端与其中一个探针(1,2)的针头固定连接,另一端可与其余任意一个探针(1,2)的针头接触连接。探针(1,2)之间的短接使用柔性连接,可以使高频阻抗测试的探针(1,2)针尖间距和角度实现可调,节约了探针组的成本并提高了工作效率和测试精度,同时使阻抗测试的自动化生产变为可能。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Chinese (ZH)
Filing Language: Chinese (ZH)