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1. (WO2019060999) INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN ATOM-DEFINED STRUCTURES
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Pub. No.: WO/2019/060999 International Application No.: PCT/CA2018/051224
Publication Date: 04.04.2019 International Filing Date: 28.09.2018
IPC:
B82B 3/00 (2006.01) ,G06N 3/08 (2006.01) ,G01Q 60/24 (2010.01) ,G01Q 60/04 (2010.01)
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
B
NANO-STRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
3
Manufacture or treatment of nano-structures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
N
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
3
Computer systems based on biological models
02
using neural network models
08
Learning methods
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
24
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
02
Multiple-type SPM, i.e. involving two or more SPM techniques
04
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
Applicants:
QUANTUM SILICON INC. [CA/CA]; 11421 Saskatchewan Drive Edmonton, Alberta T6G 2M9, CA
Inventors:
WOLKOW, Robert; CA
RASHIDI, Mohammad; CA
VINE, Wyatt; CA
DIENEL, Thomas; CA
LIVADARU, Lucian; CA
HUFF, Taleana; CA
RETALLICK, Jacob; CA
WALUS, Konrad; CA
Agent:
RIDOUT & MAYBEE LLP; 5500 North Service Road Suite 101 Burlington, Ontario L7L 6W6, CA
LEACH, Steven; CA
Priority Data:
62/564,73428.09.2017US
Title (EN) INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN ATOM-DEFINED STRUCTURES
(FR) INITIATION ET SURVEILLANCE DE L'ÉVOLUTION D'ÉLECTRONS INDIVIDUELS DANS DES STRUCTURES DÉFINIES PAR UN ATOME
Abstract:
(EN) A method for the patterning and control of single electrons on a surface is provided that includes implementing scanning tunneling microscopy hydrogen lithography with a scanning probe microscope to form charge structures with one or more confined charges; performing a series of field-free atomic force microscopy measurements on the charge structures with different tip heights, where interaction between the tip and the confined charge are elucidated; and adjusting tip heights to controllably position charges within the structures to write a given charge state. The present disclose also provides a Gibb's distribution machine formed with the method for the patterning and control of single electrons on a surface. A multi bit true random number generator and neural network learning hardware formed with the above described method are also provided.
(FR) L'invention concerne un procédé destiné à la formation de motifs et la commande d'électrons individuels sur une surface, qui comprend la mise en œuvre d'une lithographie à l'hydrogène par microscopie à effet tunnel à balayage utilisant un microscope à sonde à balayage pour former des structures de charge comptant au moins une charge confinée ; la réalisation d'une série de mesures de microscopie à force atomique sans champ sur les structures de charge selon différentes hauteurs de pointe, l'interaction entre la pointe et la charge confinée étant élucidée ; et le réglage de hauteurs de pointe pour positionner de manière réglable des charges à l'intérieur des structures, pour écrire un état de charge donné. La présente invention concerne également une machine de distribution de Gibb, formée selon le procédé de formation de motifs et de commande d'électrons individuels sur une surface. L'invention concerne également un générateur de nombres aléatoires vrais multi-bits et un matériel d'apprentissage de réseau neuronal formé selon le procédé décrit ci-dessus.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)