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1. WO2019051300 - MEASUREMENT SYSTEM AND CALIBRATION METHOD WITH WIDEBAND MODULATION

Publication Number WO/2019/051300
Publication Date 14.03.2019
International Application No. PCT/US2018/050062
International Filing Date 07.09.2018
IPC
G01R 27/32 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
28Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response
32in circuits having distributed constants
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 27/32
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks ; using network analysers; Measuring transient response
32in circuits having distributed constants ; , e.g. having very long conductors or involving high frequencies
G01R 31/2822
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
2822of microwave or radiofrequency circuits
G01R 31/31905
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuit
31903tester configuration
31905Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
H04L 25/0278
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
25Baseband systems
02Details
0264Arrangements for coupling to transmission lines
0278Arrangements for impedance matching
H04L 25/0298
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
25Baseband systems
02Details
0264Arrangements for coupling to transmission lines
0298Arrangement for terminating transmission lines
Applicants
  • MAURY MICROWAVE, INC. [US]/[US]
Inventors
  • SIMPSON, Gary, R.
  • PADMANABHAN, Sathya
  • DUDKIEWICZ, Steven, M.
  • BUBER, M., Tekamül
  • ESPOSITO, Giampiero
Agents
  • ROBERTS, Larry, K.
Priority Data
16/115,15828.08.2018US
62/556,25608.09.2017US
62/559,45515.09.2017US
62/561,61821.09.2017US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) MEASUREMENT SYSTEM AND CALIBRATION METHOD WITH WIDEBAND MODULATION
(FR) SYSTÈME DE MESURE ET PROCÉDÉ D’ÉTALONNAGE AVEC MODULATION À LARGE BANDE
Abstract
(EN)
A load pull system and method for calibrating the system and conducting measurements on a Device Under Test (DUT). The system includes at least one passive tuner; and a modulated signal connected to the DUT input. The passive tuner is calibrated at multiple frequencies within the modulation bandwidth of the modulated signal. The impedance and measured quantities such as power at the DUT reference plane are determined using tuner s-parameters at multiple frequencies within the modulation bandwidth.
(FR)
La présente invention concerne un système de traction de charge et un procédé d’étalonnage du système et de conduite de mesures sur un dispositif à l’essai (DUT). Le système comprend au moins un syntoniseur passif ; et un signal modulé connecté à l’entrée du DUT. Le syntoniseur passif est étalonné à des fréquences multiples dans la largeur de bande de modulation du signal modulé. L’impédance et les quantités mesurées telles que la puissance au niveau du plan de référence du DUT sont déterminées au moyen de paramètres s de syntoniseur à des fréquences multiples dans la largeur de bande de modulation.
Also published as
Latest bibliographic data on file with the International Bureau