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1. (WO2019049780) SEMICONDUCTOR MODULE BONDING STRUCTURE AND BONDING METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2019/049780 International Application No.: PCT/JP2018/032339
Publication Date: 14.03.2019 International Filing Date: 31.08.2018
IPC:
H02M 7/48 (2007.01) ,H01L 23/48 (2006.01) ,H01R 4/02 (2006.01) ,H01R 43/02 (2006.01)
H ELECTRICITY
02
GENERATION, CONVERSION, OR DISTRIBUTION OF ELECTRIC POWER
M
APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
7
Conversion of ac power input into dc power output; Conversion of dc power input into ac power output
42
Conversion of dc power input into ac power output without possibility of reversal
44
by static converters
48
using discharge tubes with control electrode or semiconductor devices with control electrode
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
23
Details of semiconductor or other solid state devices
48
Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads or terminal arrangements
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
R
ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
4
Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
02
Soldered or welded connections
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
R
ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
43
Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
02
for soldered or welded connections
Applicants:
株式会社デンソー DENSO CORPORATION [JP/JP]; 愛知県刈谷市昭和町1丁目1番地 1-1, Showa-cho, Kariya-city, Aichi 4488661, JP
Inventors:
原田 脩央 HARADA Naohisa; JP
近藤 浩 KONDO Hiroshi; JP
石川 喬介 ISHIKAWA Kyosuke; JP
川出 篤 KAWADE Atsushi; JP
Agent:
特許業務法人あいち国際特許事務所 AICHI, TAKAHASHI, IWAKURA & ASSOCIATES; 愛知県名古屋市中村区名駅3丁目26番19号 名駅永田ビル Meieki Nagata Building, 26-19, Meieki 3-chome, Nakamura-ku, Nagoya-shi, Aichi 4500002, JP
Priority Data:
2017-17040405.09.2017JP
Title (EN) SEMICONDUCTOR MODULE BONDING STRUCTURE AND BONDING METHOD
(FR) STRUCTURE DE LIAISON DE MODULE À SEMI-CONDUCTEUR ET PROCÉDÉ DE LIAISON
(JA) 半導体モジュールの接合構造及び接合方法
Abstract:
(EN) A semiconductor module bonding structure (4a) comprises: a semiconductor module (11) including a semiconductor element (12) and a positive electrode terminal (12p) serving as a plate-like power terminal electrically connected to the semiconductor element (12); and a main P-bus bar (6) serving as a bus bar including a plate-like bonding portion (7) bonded to the positive electrode terminal (12p) of the semiconductor module (11). The positive electrode terminal (12p) of the semiconductor module (11) and the bonding portion (7) of the main P-bus bar (6) are configured such that the positive electrode terminal (12p), which has a relatively smaller plate thickness, has a plate width greater than a plate width of the bonding portion (7), which has a relatively greater plate thickness. The positive electrode terminal (12p) and the bonding portion (7) are bonded to each other by performing fusion-welding in an arrangement in which the respective plate thickness directions are orthogonal to each other.
(FR) L'invention concerne une structure de liaison de module à semi-conducteur (4a) comprenant : un module à semi-conducteur (11) comprenant un élément semi-conducteur (12) et une borne d'électrode positive (12p) servant de borne électrique tabulaire connectée électriquement à l'élément semi-conducteur (12) ; et une barre omnibus P principale (6) servant de barre omnibus comprenant une partie de liaison tabulaire (7) liée à la borne d'électrode positive (12p) du module à semi-conducteur (11). La borne d'électrode positive (12p) du module à semi-conducteur (11) et la partie de liaison (7) de la barre omnibus P principale (6) sont conçues de telle sorte que la borne d'électrode positive (12p), dont l'épaisseur de plaque est relativement plus petite, présente une largeur de plaque supérieure à une largeur de plaque de la partie de liaison (7), dont l'épaisseur de plaque est relativement plus grande. La borne d'électrode positive (12p) et la partie de liaison (7) sont liées l'une à l'autre par réalisation d'un soudage par fusion dans un agencement dans lequel les directions d'épaisseur de plaque respectives sont orthogonales l'une à l'autre.
(JA) 半導体モジュールの接合構造(4a)は、半導体素子(12)と、半導体素子(12)に電気的に接続された板状のパワー端子としての正極端子(12p)と、を有する半導体モジュール(11)と、半導体モジュール(11)の正極端子(12p)に接合された板状の接合部(7)を有するバスバーとしての主Pバスバー(6)と、を備え、半導体モジュール(11)の正極端子(12p)と主Pバスバー(6)の接合部(7)は、相対的に板厚の小さい方である正極端子(12p)の板幅が相対的に板厚の大きい方である接合部(7)の板幅を上回るように構成され、且つそれぞれの板厚方向が互いに直交するように配置された状態で溶融溶接によって接合されている。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)