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1. (WO2019048299) INTERFACE ELEMENT FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND CORRESPONDING MANUFACTURING METHOD
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Pub. No.: WO/2019/048299 International Application No.: PCT/EP2018/073187
Publication Date: 14.03.2019 International Filing Date: 29.08.2018
IPC:
G01R 1/073 (2006.01) ,G01R 1/067 (2006.01) ,G01R 3/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
073
Multiple probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
3
Apparatus or processes specially adapted for the manufacture of measuring instruments
Applicants:
TECHNOPROBE S.P.A. [IT/IT]; Via Cavalieri di Vittorio Veneto, 2 23870 Cernusco Lombardone (Lecco), IT
Inventors:
CRIPPA, Roberto; IT
VETTORI, Riccardo; IT
Agent:
FERRARI, Barbara; IT
Priority Data:
10201700010052207.09.2017IT
Title (EN) INTERFACE ELEMENT FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND CORRESPONDING MANUFACTURING METHOD
(FR) ÉLÉMENT D’INTERFACE POUR APPAREIL D’ESSAI DE DISPOSITIFS ÉLECTRONIQUES ET PROCÉDÉ DE FABRICATION CORRESPONDANT
Abstract:
(EN) An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a first end(23a) and a second end (23b). Suitably, the interconnections elements (23) are made of a conductive elastomer that fills the openings (22) of the support (21), each of said interconnection elements (23) forming a conductive channel between different and opposing faces(Fa, Fb) of said support (21).
(FR) La présente invention concerne un élément d’interface (20) pour un appareil d’essai de dispositifs électroniques qui comprend au moins un support (21) pourvu d’une pluralité d’ouvertures traversantes (22) qui contiennent des éléments d’interconnexion respectifs (23), qui s’étendent entre une première extrémité (23a) et une deuxième extrémité (23b). De manière appropriée, les éléments d’interconnexion (23) sont constitués d’un élastomère conducteur qui remplit les ouvertures (22) du support (21), chacun desdits éléments d’interconnexion (23) formant un canal conducteur entre différentes faces opposées (Fa, Fb) dudit support (21).
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)