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1. (WO2019047702) MICRO TOTAL ANALYSIS SYSTEM AND METHOD
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Pub. No.: WO/2019/047702 International Application No.: PCT/CN2018/100834
Publication Date: 14.03.2019 International Filing Date: 16.08.2018
IPC:
G01N 21/17 (2006.01) ,G01N 21/64 (2006.01) ,G01N 27/22 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
02
by investigating impedance
22
by investigating capacitance
Applicants:
京东方科技集团股份有限公司 BOE TECHNOLOGY GROUP CO., LTD. [CN/CN]; 中国北京市 朝阳区酒仙桥路10号 No.10 Jiuxianqiao Rd. Chaoyang District Beijing 100015, CN
Inventors:
董学 DONG, Xue; CN
韩艳玲 HAN, Yanling; CN
王海生 WANG, Haisheng; CN
车春城 CHE, Chuncheng; CN
丁小梁 DING, Xiaoliang; CN
刘英明 LIU, Yingming; CN
郭玉珍 GUO, Yuzhen; CN
徐婉娴 XU, Wanxian; CN
蔡佩芝 CAI, Peizhi; CN
崔皓辰 CUI, Haochen; CN
庞凤春 PANG, Fengchun; CN
Agent:
北京市柳沈律师事务所 LIU, SHEN & ASSOCIATES; 中国北京市 海淀区彩和坊路10号1号楼10层 10th Floor, Building 1 10 Caihefang Road Haidian District Beijing 100080, CN
Priority Data:
201710797437.606.09.2017CN
Title (EN) MICRO TOTAL ANALYSIS SYSTEM AND METHOD
(FR) SYSTÈME ET PROCÉDÉ DE MICROANALYSE TOTALE
(ZH) 微全分析系统及方法
Abstract:
(EN) A micro total analysis system and method. The micro total analysis system comprises: a microfluidic device (10) configured to contain a liquid to be tested (131); an optical unit (20) configured to generate first light (L1) irradiated to the microfluidic device (10); and a test unit (30) configured to detect the liquid to be tested (131) and output a test signal to obtain test information. The micro total analysis system is highly integrated, and can realize operation and test of the liquid to be tested and/or the components thereof.
(FR) La présente invention concerne un système et un procédé de microanalyse totale. Le système de microanalyse totale comprend : un dispositif microfluidique (10) configuré pour contenir un liquide à tester (131) ; une unité optique (20) configurée pour générer une première lumière (L1) irradiée vers le dispositif microfluidique (10) ; et une unité de test (30) configurée pour détecter le liquide à tester (131) et délivrer en sortie un signal de test pour obtenir des informations de test. Le système de microanalyse totale est hautement intégré, et peut effectuer la commande et le test du liquide à tester et/ou des composants de celui-ci.
(ZH) 一种微全分析系统及方法。微全分析系统包括:微流控器件(10),被配置为容纳待检测的液体(131);光学单元(20),被配置为形成照射到微流控器件(10)的第一光(L1),以及检测单元(30),被配置为检测待检测的液体(131)并输出检测信号以获得检测信息。微全分析系统集成度高,可实现待检测的液体和/或其成分的操作和检测。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Chinese (ZH)
Filing Language: Chinese (ZH)