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1. WO2019046197 - SEMICONDUCTOR DIE WITH DIFFERENT MAGNETIC TUNNEL JUNCTIONS IN DIFFERENT MAGNETO-RESISTIVE RANDOM ACCESS MEMORY ARRAYS

Publication Number WO/2019/046197
Publication Date 07.03.2019
International Application No. PCT/US2018/048158
International Filing Date 27.08.2018
IPC
H01L 27/22 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
22including components using galvano-magnetic effects, e.g. Hall effect; using similar magnetic field effects
H01L 43/08 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
43Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof
08Magnetic-field-controlled resistors
H01L 43/12 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
43Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof
12Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
CPC
G11C 11/15
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
02using magnetic elements
14using thin-film elements
15using multiple magnetic layers
G11C 11/161
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
02using magnetic elements
16using elements in which the storage effect is based on magnetic spin effect
161details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
G11C 11/1653
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
02using magnetic elements
16using elements in which the storage effect is based on magnetic spin effect
165Auxiliary circuits
1653Address circuits or decoders
G11C 11/1659
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
02using magnetic elements
16using elements in which the storage effect is based on magnetic spin effect
165Auxiliary circuits
1659Cell access
G11C 11/1675
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
02using magnetic elements
16using elements in which the storage effect is based on magnetic spin effect
165Auxiliary circuits
1675Writing or programming circuits or methods
H01F 10/3295
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
10Thin magnetic films, e.g. of one-domain structure
32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
3295Spin-exchange coupled multilayers wherein the magnetic pinned or free layers are laminated without anti-parallel coupling within the pinned and free layers
Applicants
  • QUALCOMM INCORPORATED [US]/[US]
Inventors
  • LI, Xia
  • CHEN, Wei-Chuan
  • HSU, Wah Nam
  • KANG, Seung, Hyuk
Agents
  • TERRANOVA, Steven, N.
Priority Data
15/688,21228.08.2017US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SEMICONDUCTOR DIE WITH DIFFERENT MAGNETIC TUNNEL JUNCTIONS IN DIFFERENT MAGNETO-RESISTIVE RANDOM ACCESS MEMORY ARRAYS
(FR) PUCE SEMI-CONDUCTRICE AYANT DES JONCTIONS À EFFET TUNNEL MAGNÉTIQUES DIFFÉRENTES DANS DES RÉSEAUX DE MÉMOIRE VIVE MAGNÉTO-RÉSISTIVE DIFFÉRENTS
Abstract
(EN)
The energy barrier of a magnetic tunnel junction (MTJ) affects its write performance as the amount of current required to switch the magnetic orientation of a free layer of the MTJ is a function of its energy barrier. Thus, by varying the energy barriers of MTJ stacks (204) in different magneto-resistive random access memory (MRAM) arrays (208) in a semiconductor die (200), different MRAM arrays may be used for different types of memory provided in the semiconductor die while still achieving distinct performance specifications. The energy barriers can be varied by varying the materials, heights, widths, and/or other characteristics of the MTJ stacks.
(FR)
Dans la présente invention, la barrière énergétique d'une jonction à effet tunnel magnétique (MTJ) a une incidence sur sa performance d'écriture étant donné que la quantité de courant nécessaire à la commutation de l'orientation magnétique d'une couche libre de la MTJ dépend de sa barrière énergétique. Ainsi, par variation des barrières énergétiques d'empilements MTJ (204) dans des réseaux de mémoire vive magnéto-résistive (MRAM) (208) différents dans une puce semi-conductrice (200), des réseaux de MRAM différents peuvent être utilisés pour des types de mémoire différents compris dans la puce semi-conductrice tout en assurant des spécifications de performance distinctes. On peut faire varier les barrières énergétiques par variation des matériaux, des hauteurs, des largeurs et/ou d'autres caractéristiques des empilements MTJ.
Also published as
Latest bibliographic data on file with the International Bureau