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1. (WO2019046016) AUTOMATED TEST SYSTEM EMPLOYING ROBOTICS
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Pub. No.: WO/2019/046016 International Application No.: PCT/US2018/046734
Publication Date: 07.03.2019 International Filing Date: 14.08.2018
IPC:
G01R 31/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
TERADYNE, INC. [US/US]; 600 Riverpark Drive North Reading, Massachusetts 01864, US
Inventors:
BOWYER, David Paul; GB
PEI, Jianfa; US
TOSCANO, John P.; US
CAMPBELL, Philip; US
CARVALHO, Valquirio Nazare; US
Agent:
PYSHER, Paul A.; US
ADATO, Ronen; US
AUGST, Alexander D.; US
BUTEAU, Kristen C.; US
BYCHOWSKI, Meaghan E.; US
FORCIER, John V.; US
HAULBROOK, William R.; US
JARRELL, Brenda Herschbach; US
KLEIN, Daniel A.; US
LI, Bin; US
LI, Xiaodong; US
LYON, Charles E.; US
MEDINA, Rolando; US
MONROE, Margo R.; US
PACE, Nicholas J.; US
REARICK, John P.; US
REESE, Brian E.; US
SAHR, Robert N.; US
SCHMITT, Michael; US
SCHONEWALD, Stephanie L.; US
SHAIKH, Nishat A.; US
SHINALL, Michael A.; US
SHORE, David E.; US
SMITH, Maria C.; US
SUH, Su Kyung; US
TSE, Janet M.; US
VETTER, Michael L.; US
VRABLIK, Tracy L.; US
Priority Data:
15/688,10428.08.2017US
Title (EN) AUTOMATED TEST SYSTEM EMPLOYING ROBOTICS
(FR) SYSTÈME D'ESSAI AUTOMATISÉ UTILISANT LA ROBOTIQUE
Abstract:
(EN) An example test system includes robotics configured to operate on devices at a first level of precision, and stages configured to operate at levels of precision that are less than the first level of precision. Each of the stages may include parallel paths that are configured to pass the devices between adjacent stages.
(FR) L'invention concerne un système d'essai illustratif qui comprend de la robotique conçue pour fonctionner sur des dispositifs à un premier niveau de précision, et des étages conçus pour fonctionner à des niveaux de précision qui sont inférieurs au premier niveau de précision. Chacun des étages peut comprendre des trajets parallèles qui sont conçus pour faire passer les dispositifs entre des étages adjacents.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)