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1. (WO2019046015) AUTOMATED TEST SYSTEM HAVING MULTIPLE STAGES
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Pub. No.: WO/2019/046015 International Application No.: PCT/US2018/046725
Publication Date: 07.03.2019 International Filing Date: 14.08.2018
IPC:
G01R 31/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
TERADYNE, INC. [US/US]; 600 Riverpark Drive North Reading, Massachusetts 01864, US
Inventors:
BOWYER, David Paul; GB
PEI, Jianfa; US
TOSCANO, John P.; US
CAMPBELL, Philip; US
SMITH, Marc LeSueur; US
Agent:
PYSHER, Paul A.; US
ADATO, Ronen; US
AUGST, Alexander D.; US
BUTEAU, Kristen C.; US
BYCHOWSKI, Meaghan E.; US
FORCIER, John V.; US
HAULBROOK, William R.; US
JARRELL, Brenda Herschbach; US
KLEIN, Daniel A.; US
LI, Bin; US
LI, Xiaodong; US
LYON, Charles E.; US
MEDINA, Rolando; US
MONROE, Margo R.; US
PACE, Nicholas J.; US
REARICK, John P.; US
REESE, Brian E.; US
SAHR, Robert N.; US
SCHMITT, Michael; US
SCHONEWALD, Stephanie L.; US
SHAIKH, Nishat A.; US
SHINALL, Michael A.; US
SHORE, David E.; US
SMITH, Maria C.; US
SUH, Su Kyung; US
TSE, Janet M.; US
VETTER, Michael L.; US
VRABLIK, Tracy L.; US
Priority Data:
15/688,07328.08.2017US
Title (EN) AUTOMATED TEST SYSTEM HAVING MULTIPLE STAGES
(FR) SYSTÈME DE TEST AUTOMATISÉ COMPRENANT DES ÉTAGES MULTIPLES
Abstract:
(EN) An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.
(FR) L'invention concerne un système de test donné à titre d'exemple comprenant : une étagère de test comprenant des fentes de test ; des première et seconde navettes qui sont conçues pour se déplacer simultanément pour transporter des dispositifs vers des plateaux et à distance des plateaux, au moins certains des dispositifs ayant été testés et au moins certains des dispositifs étant à tester ; des premier et second robots qui sont configurés pour se déplacer simultanément pour déplacer les dispositifs qui ont été testés à partir de réceptacles de test dans des supports de test vers les première et seconde navettes et pour déplacer les dispositifs à tester depuis les première et seconde navettes jusqu'aux réceptacles de test dans des supports de test ; et des premier et second bras de test qui sont conçus pour se déplacer simultanément pour déplacer les supports de test entre les premier et second robots et l'étagère de test.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)