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1. (WO2019045426) TEST SOCKET AND CONDUCTIVE PARTICLES
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Pub. No.: WO/2019/045426 International Application No.: PCT/KR2018/009939
Publication Date: 07.03.2019 International Filing Date: 29.08.2018
IPC:
G01R 1/067 (2006.01) ,G01R 1/073 (2006.01) ,G01R 1/04 (2006.01) ,G01R 31/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
073
Multiple probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
04
Housings; Supporting members; Arrangements of terminals
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
주식회사 아이에스시 ISC CO., LTD. [KR/KR]; 경기도 성남시 중원구 갈마치로 215, 6층 6F, 215, Galmachi-ro, Jungwon-gu, Seongnam-si, Gyeonggi-do 13217, KR
Inventors:
정영배 CHUNG, Young Bae; KR
Agent:
리앤목 특허법인 Y.P.LEE, MOCK & PARTNERS; 서울시 강남구 언주로 30길 13 대림아크로텔 12층 12F Daerim Acrotel, 13 Eonju-ro 30-gil Gangnam-gu Seoul 06292, KR
Priority Data:
10-2017-011066031.08.2017KR
Title (EN) TEST SOCKET AND CONDUCTIVE PARTICLES
(FR) PRISE DE TEST ET PARTICULES CONDUCTRICES
(KO) 검사용 소켓 및 도전성 입자
Abstract:
(EN) The present invention relates to a test socket and conductive particles, and more specifically, to a test socket disposed between a device to be tested and a testing device so as to electrically connect a terminal of the device to be tested and a pad of the testing device. The test socket comprises: a plurality of conductive parts provided at each position corresponding to the terminal of the device to be tested, and having a plurality of conductive particles arranged in the vertical direction within an elastic insulating material; and insulating support parts provided between the plurality of conductive parts, and electrically insulating the conductive parts from each other while supporting each of the conductive parts, wherein at least one of the conductive particles includes: a body part made of a metal material and forming an outer shape of the conductive particle; and a plurality of silica particles having one part fixed within the body part, having the remaining part protruding from the body part, and making contact with the elastic insulating material, which forms the conductive parts, so as to be firmly coupled to the elastic insulating material.
(FR) La présente invention concerne une prise de test et des particules conductrices et plus particulièrement une prise de test disposée entre un dispositif à tester et un dispositif de test de façon à connecter électriquement une borne du dispositif à tester et un tampon du dispositif de test. La prise de test comprend : une pluralité de parties conductrices disposées à chaque position correspondant à la borne du dispositif à tester, et présentant une pluralité de particules conductrices agencées dans la direction verticale à l'intérieur d'un matériau isolant élastique ; et des parties de maintien isolantes disposées entre la pluralité de parties conductrices, et isolant électriquement les parties conductrices les unes des autres tout en maintenant chacune des parties conductrices, au moins l'une des particules conductrices comprenant : une partie de corps constituée d'un matériau métallique et formant une forme externe de la particule conductrice ; et une pluralité de particules de silice présentant une partie fixée à l'intérieur de la partie de corps, la partie restante faisant saillie depuis la partie de corps, et en contact avec le matériau isolant élastique, qui forme les parties conductrices, de manière à être fermement couplée au matériau isolant élastique.
(KO) 본 발명은 검사용 소켓 및 도전성 입자에 대한 것으로서, 더욱 상세하게는 피검사 디바이스와 검사장치 사이에 배치되어 상기 피검사 디바이스의 단자와 검사장치의 패드를 서로 전기적으로 연결시키기 위한 검사용 소켓에 있어서, 상기 피검사 디바이스의 단자와 대응되는 위치마다 마련되고 탄성 절연물질 내에 다수의 도전성 입자가 상하방향으로 배열되어 있는 복수의 도전부; 및 상기 복수의 도전부 사이에 마련되고 각각의 도전부를 지지하면서 도전부를 서로 전기적으로 절연시키는 절연성 지지부;를 포함하되, 상기 도전성 입자 중 적어도 하나는, 금속소재로 이루어지며 도전성 입자의 외형을 구성하는 몸체부와, 일부는 상기 몸체부 내에 고정되고 나머지 일부는 상기 몸체부로부터 돌출되며, 도전부를 구성하는 탄성 절연물질과 접촉되어 상기 탄성 절연물질과 견고하게 결합되는 다수의 실리카 미립자를 포함하는 검사용 소켓에 대한 것이다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)