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1. (WO2019045425) TEST SOCKET COMPRISING CARBON NANOTUBES
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Pub. No.: WO/2019/045425 International Application No.: PCT/KR2018/009938
Publication Date: 07.03.2019 International Filing Date: 29.08.2018
IPC:
G01R 1/067 (2006.01) ,G01R 1/073 (2006.01) ,G01R 1/04 (2006.01) ,G01R 31/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
073
Multiple probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
04
Housings; Supporting members; Arrangements of terminals
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
주식회사 아이에스시 ISC CO., LTD. [KR/KR]; 경기도 성남시 중원구 갈마치로 215, 6층 6F, 215, Galmachi-ro, Jungwon-gu, Seongnam-si, Gyeonggi-do 13217, KR
Inventors:
정영배 CHUNG, Young Bae; KR
Agent:
리앤목 특허법인 Y.P.LEE, MOCK & PARTNERS; 서울시 강남구 언주로 30길 13 대림아크로텔 12층 12F Daerim Acrotel, 13 Eonju-ro 30-gil Gangnam-gu Seoul 06292, KR
Priority Data:
10-2017-011065931.08.2017KR
Title (EN) TEST SOCKET COMPRISING CARBON NANOTUBES
(FR) PRISE DE TEST COMPRENANT DES NANOTUBES DE CARBONE
(KO) 탄소나노튜브가 포함된 검사용 소켓
Abstract:
(EN) The present invention relates to a test socket comprising carbon nanotubes and, more specifically, to a test socket comprising carbon nanotubes, comprising: a plurality of conductive parts located at respective positions corresponding to terminals of a device to be tested, and having a plurality of conductive particles arranged widthwise within a first insulative elastic material; insulative support parts arranged between the conductive parts so as to surround and support same, and made of a second insulative elastic material; and carbon nanotubes arranged so as to be dispersed inside the insulative support parts, wherein the surfaces of the carbon nanotubes are coated with silica.
(FR) La présente invention concerne une prise de test comprenant des nanotubes de carbone et plus particulièrement une prise de test comprenant des nanotubes de carbone comprenant : une pluralité de parties conductrices situées à des positions respectives correspondant aux bornes d'un dispositif à tester, et présentant une pluralité de particules conductrices disposées dans le sens de la largeur à l'intérieur d'un premier matériau élastique isolant ; des parties de maintien isolantes disposées entre les parties conductrices de manière à entourer et à maintenir ces dernières, et constituées d'un second matériau élastique isolant ; et des nanotubes de carbone disposés de manière à être dispersés à l'intérieur des parties de maintien isolantes, les surfaces des nanotubes de carbone étant revêtues de silice.
(KO) 본 발명은 탄소나노튜브가 포함된 검사용 소켓에 대한 것으로서, 더욱 상세하게는 피검사 디바이스의 단자와 대응되는 위치마다 제1 절연성 탄성물질 내에 다수의 도전성 입자가 두께방향으로 배열되어 있는 복수의 도전부와, 각각의 도전부 사이에 배치되어 도전부를 감싸면서 도전부를 지지하며 제2 절연성 탄성물질로 이루어지는 절연지지부와, 상기 절연지지부 내부에 분산되어 배치되는 탄소나노튜브를 포함하되, 상기 탄소나노튜브는, 그 표면에 실리카(Silica)가 코팅되어 있는 것을 특징으로 하는 탄소나노튜브가 포함된 검사용 소켓에 대한 것이다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)