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1. (WO2019045152) THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT METHOD WHICH ARE FOR NON-CONTACT THREE-DIMENSIONAL MEASURING INSTRUMENT
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Pub. No.: WO/2019/045152 International Application No.: PCT/KR2017/009619
Publication Date: 07.03.2019 International Filing Date: 01.09.2017
IPC:
G01B 11/24 (2006.01) ,G01B 9/02 (2006.01) ,G02B 27/10 (2006.01) ,H04N 5/225 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9
Instruments as specified in the subgroups and characterised by the use of optical measuring means
02
Interferometers
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
27
Other optical systems; Other optical apparatus
10
Beam splitting or combining systems
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
5
Details of television systems
222
Studio circuitry; Studio devices; Studio equipment
225
Television cameras
Applicants:
(주)비에스텍 BSTECH [KR/KR]; 경기도 화성시 삼성1로4길 45 45, Samsung 1-ro 4-gil Hwaseong-si Gyeonggi-do 18449, KR
Inventors:
오창환 OH, Chang Hwan; KR
Agent:
이진규 LEE, Jin Gyu; KR
Priority Data:
10-2017-011201101.09.2017KR
Title (EN) THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT METHOD WHICH ARE FOR NON-CONTACT THREE-DIMENSIONAL MEASURING INSTRUMENT
(FR) SYSTÈME DE MESURE OPTIQUE INTÉGRÉ TRIDIMENSIONNEL ET PROCÉDÉ DE MESURE OPTIQUE INTÉGRÉ TRIDIMENSIONNEL DESTINÉS À UN INSTRUMENT DE MESURE TRIDIMENSIONNEL SANS CONTACT
(KO) 비접촉 3차원 측정기를 위한 3차원 통합 광학측정 시스템 및 3차원 통합 광학측정 방법
Abstract:
(EN) The present invention relates to an integrated optical measurement system and a three-dimensional integrated optical measurement method which are for a non-contact three-dimensional measuring instrument and, more particularly, to a method for constructing, into an integrated system, an image measuring unit, a pointer laser measuring unit, a line laser measuring unit and a WSI measuring unit, and performing three-dimensional measurement therethrough. According to the present invention, heights can be measured in correspondence to various shapes and sizes, the height of a small photographed object can be precisely measured, and since the time required to obtain a height value with a small error range can be shortened, the time for obtaining three-dimensional measurement data from the photographed object can be significantly reduced.
(FR) La présente invention concerne un système de mesure optique intégré et un procédé de mesure optique intégré tridimensionnel destinés à un instrument de mesure tridimensionnel sans contact et, plus précisément, un procédé de construction, dans un système intégré, d'une unité de mesure d'image, d'une unité de mesure de laser de pointage, d'une unité de mesure de laser de ligne et d'une unité de mesure de WSI, et la réalisation d'une mesure tridimensionnelle par l'intermédiaire de ces dernières. Selon la présente invention, des hauteurs peuvent être mesurées en correspondance avec diverses formes et tailles, la hauteur d'un petit objet photographié peut être mesurée avec précision, et étant donné que le temps d'obtention d'une valeur de hauteur à faible plage d'erreur peut être raccourci, le temps d'obtention de données de mesure tridimensionnelles à partir de l'objet photographié peut être considérablement réduit.
(KO) 본 발명은 비접촉 3차원 측정기를 위한 통합 광학측정 시스템 및 3차원 통합 광학측정 방법에 관한 것으로서, 이미지 측정부, 포인터 레이저 측정부, 라인 레이저 측정부, WSI 측정부를 통합 시스템으로 구축하고 이를 통해 3차원 측정을 수행하는 방법에 관한 것이다. 본 발명에 따르면, 다양한 형태 및 크기에 대응하여 높이 측정이 가능하고, 작은 크기의 촬영물의 높이를 정밀하게 측정하되, 오차 범위가 작은 높이 값을 얻기까지의 시간을 단축시킬 수 있어 촬영물로부터 3차원 측정 데이터를 얻는 시간을 대폭 줄일 수 있다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)