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1. (WO2019044870) VISUAL INSPECTION DEVICE AND PRODUCT MANUFACTURING SYSTEM
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Pub. No.: WO/2019/044870 International Application No.: PCT/JP2018/031867
Publication Date: 07.03.2019 International Filing Date: 29.08.2018
IPC:
G01N 21/88 (2006.01) ,G01N 21/84 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
Applicants:
日本電産コパル株式会社 NIDEC COPAL CORPORATION [JP/JP]; 東京都板橋区志村2丁目18番10号 18-10, Shimura 2-chome, Itabashi-ku, Tokyo 1748550, JP
Inventors:
恩田 衛 ONDA Mamoru; JP
齊藤 俊樹 SAITOH Toshiki; JP
大山 正敬 OYAMA Masataka; JP
筒井 正治 TSUTSUI Masaji; JP
Agent:
森 友宏 MORI Tomohiro; JP
Priority Data:
2017-16934804.09.2017JP
Title (EN) VISUAL INSPECTION DEVICE AND PRODUCT MANUFACTURING SYSTEM
(FR) DISPOSITIF D'INSPECTION VISUELLE ET SYSTÈME DE FABRICATION DE PRODUIT
(JA) 外観検査装置及び製品製造システム
Abstract:
(EN) Provided is a visual inspection device capable of accurately detecting a scratch, a dent, or a stain on the surface of an object to be inspected. A visual inspection device 3 is provided with: a support stage 20 for supporting an object 10 to be inspected; a light source 40 for irradiating the object 10 to be inspected on the support stage 20 with inspection light L; an imaging unit 30 for imaging the appearance of the object 10 to be inspected irradiated with the inspection light L from the light source 40; and an articulated robot 50 to which the light source 40 is attached. The articulated robot 50 moves the light source 40 relative to the object 10 to be inspected while varying the relative positional relationship between the light source 40 and the imaging unit 30.
(FR) L'invention concerne un dispositif d'inspection visuelle pouvant détecter avec précision une rayure, un creux ou une tache sur la surface d'un objet devant être inspecté. Un dispositif d'inspection visuelle (3) comprend : un étage de support (20) permettant de soutenir un objet (10) devant être inspecté ; une source de lumière (40) permettant d'exposer l'objet (10) devant être inspecté sur l'étage de support (20) au moyen d'une lumière d'inspection L ; une unité d'imagerie (30) permettant de capturer l'aspect de l'objet (10) devant être inspecté exposé au moyen de la lumière d'inspection L provenant de la source de lumière (40) ; et un robot articulé (50) auquel la source de lumière (40) est fixée. Le robot articulé (50) déplace la source de lumière (40) par rapport à l'objet (10) devant être inspecté tout en faisant varier la relation de position relative entre la source de lumière (40) et l'unité d'imagerie (30).
(JA) 検査対象物の表面の傷や凹み、汚れなどを精度高く検出することができる外観検査装置を提供する。外観検査装置3は、検査対象物10を支持する支持ステージ20と、支持ステージ20上の検査対象物10に検査光Lを照射する光源40と、光源40からの検査光Lが照射された検査対象物10の外観を撮像する撮像ユニット30と、光源40が取り付けられた多関節ロボット50とを備える。多関節ロボット50は、光源40と撮像ユニット30との間の相対的位置関係を変化させつつ、光源40を検査対象物10に対して移動させる。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)